Femtosecond Z-Scan System
This femtosecond Z-Scan system combines a PI SMC-series stage, Ophir Juno power meter and optical beam-delivery system for accurate, sensitive measurement of material nonlinear refractive index, with simple setup. A Gaussian beam illuminates a sample near a focusing-lens focus. Nonlinear refractive-index changes make the medium act as a positive/negative lens, producing self-focusing/defocusing and changing far-field flux through an aperture. Moving the sample along Z from -Z through focus to +Z yields valley–peak or peak–valley transmittance curves. Theoretical analysis determines nonlinear properties. In specialized experiments, Z-Scan helps select suitable materials and is described as essential for nonlinear research/applications.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Scanning Travel [Main Technical Parameters] | 160 mm |
| Scanning Accuracy [Main Technical Parameters; Original 1um] | 1 μm |
| Energy Sensitivity [Main Technical Parameters; Original Lowercase Unit nj Retained] | 100 nj |
| Maximum Injected Energy [Main Technical Parameters; Original Lowercase Unit uj Retained] | 200 uj |
| Interface [Main Technical Parameters] | USB2.0 |
| Dimensions [Main Technical Parameters] | 76 mm × 55 mm × 22 mm |
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