Infrared Focal Plane Detector Test Device IR FPA-A
The IR FPA infrared focal-plane detector test apparatus measures pixel responsivity, responsivity nonuniformity, noise voltage, detectivity, noise-equivalent temperature difference, valid-pixel rate, fixed-pattern noise, noise-equivalent power, saturation irradiating power, dynamic range, the source's relative spectral-effect/readout-rate wording, frame rate and crosstalk. It suits cooled SWIR, MWIR and LWIR area and linear focal-plane arrays with pixel pitches of 7.5, 10, 12, 15, 25 or 30um.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Operating Pulse | 8 Channels, Programmable, Adjustable Levels |
| Operating Voltage | 4-Channel Adjustable High-Precision Voltage Source |
| Analog Signal Acquisition System | 8 Channels: 16 Bit |
| Differential Area-Source Blackbody - Emitting Area | 75mmX75mm |
| Differential Area-Source Blackbody - Absolute Temperature Range | +5°C~+85°C |
| Differential Area-Source Blackbody - Differential Temperature Range [@25°C Ambient Temperature] | -20°C~+60°C @25°C Ambient Temperature |
| Differential Area-Source Blackbody - Emissivity | 0.98±0.02 |
| Differential Area-Source Blackbody - Temperature Uniformity [RMS; @-5°C<ΔT<±5°C] | ±0.05°C RMS@-5°C<ΔT<±5°C |
| Analog Data Acquisition Card - Independent ADC Channels | 8 Pieces |
| Analog Data Acquisition Card - Total Input RMS Noise [Includes Analog-to-Digital Converter] | <100μv |
| Acquisition Card Maximum Conversion Rate [Per Channel] | Up to 80M pixels/s per Channel |
| Acquisition Card Dynamic Range | 16 bits |
Datasheet
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