Field Lens
A scan field lens is a specialized lens system that creates uniformly sized focused spots across the marking plane. It addresses off-axis deflection after the laser passes through the focusing optics and is a key laser-marker component. 同生科技 has complete manufacturing and testing equipment for high-quality optics. Its comprehensive range combines advanced technology, good service and reasonable prices. Substrate materials, dimensions, specifications, wavelengths and transmittance can be selected or customized.
Specification Snapshot
Applicable Wavelength [Square scanning field: 36x36mm; working distance: 72mm]
10.6/10
Scanning Field - Circular Diameter [Square scanning field: 36x36mm; working distance: 72mm]
φ51
Incident Beam Diameter [Square scanning field: 36x36mm; working distance: 72mm]
11 mm
Applicable Wavelength [Square scanning field: 60x60mm; working distance: 97mm]
10.6 μm
Scanning Field - Circular Diameter [Square scanning field: 60x60mm; working distance: 97mm]
φ86
Incident Beam Diameter [Square scanning field: 60x60mm; working distance: 97mm]
11 mm
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Overview
A scan field lens is a specialized lens system that creates uniformly sized focused spots across the marking plane. It addresses off-axis deflection after the laser passes through the focusing optics and is a key laser-marker component. 同生科技 has complete manufacturing and testing equipment for high-quality optics. Its comprehensive range combines advanced technology, good service and reasonable prices. Substrate materials, dimensions, specifications, wavelengths and transmittance can be selected or customized.
Specifications
| Parameter | Value |
|---|---|
| Applicable Wavelength [Square scanning field: 36x36mm; working distance: 72mm] | 10.6/10 |
| Scanning Field - Square [Square scanning field: 36x36mm; working distance: 72mm] | 36 mm × 36 mm |
| Scanning Field - Circular Diameter [Square scanning field: 36x36mm; working distance: 72mm] | φ51 |
| Working Distance [Square scanning field: 36x36mm; working distance: 72mm] | 72 mm |
| Incident Beam Diameter [Square scanning field: 36x36mm; working distance: 72mm] | 11 mm |
| Maximum Angle of Incidence [Square scanning field: 36x36mm; working distance: 72mm] | 15 ° |
| Distance from Galvanometer to Lens Center [Square scanning field: 36x36mm; working distance: 72mm] | 25 mm |
| Applicable Wavelength [Square scanning field: 60x60mm; working distance: 97mm] | 10.6 μm |
| Scanning Field - Square [Square scanning field: 60x60mm; working distance: 97mm] | 60 mm × 60 mm |
| Scanning Field - Circular Diameter [Square scanning field: 60x60mm; working distance: 97mm] | φ86 |
| Working Distance [Square scanning field: 60x60mm; working distance: 97mm] | 97 mm |
| Incident Beam Diameter [Square scanning field: 60x60mm; working distance: 97mm] | 11 mm |
| Maximum Angle of Incidence [Square scanning field: 60x60mm; working distance: 97mm] | 20 ° |
| Distance from Galvanometer to Lens Center [Square scanning field: 60x60mm; working distance: 97mm] | 25 mm |
| Applicable Wavelength [Square scanning field: 80x80mm; working distance: 102mm] | 10.6 μm |
| Scanning Field - Square [Square scanning field: 80x80mm; working distance: 102mm] | 80 mm × 80 mm |
| Scanning Field - Circular Diameter [Square scanning field: 80x80mm; working distance: 102mm] | φ113 |
| Working Distance [Square scanning field: 80x80mm; working distance: 102mm] | 102 mm |
| Incident Beam Diameter [Square scanning field: 80x80mm; working distance: 102mm] | 11 mm |
| Maximum Angle of Incidence [Square scanning field: 80x80mm; working distance: 102mm] | 25 ° |
| Distance from Galvanometer to Lens Center [Square scanning field: 80x80mm; working distance: 102mm] | 25 mm |
| Applicable Wavelength [Square scanning field: 90x90mm; working distance: 119mm] | 10.6 μm |
| Scanning Field - Square [Square scanning field: 90x90mm; working distance: 119mm] | 90 mm × 90 mm |
| Scanning Field - Circular Diameter [Square scanning field: 90x90mm; working distance: 119mm] | φ128 |
| Working Distance [Square scanning field: 90x90mm; working distance: 119mm] | 119 mm |
| Incident Beam Diameter [Square scanning field: 90x90mm; working distance: 119mm] | 11 mm |
| Maximum Angle of Incidence [Square scanning field: 90x90mm; working distance: 119mm] | 25 ° |
| Distance from Galvanometer to Lens Center [Square scanning field: 90x90mm; working distance: 119mm] | 25 mm |
| Applicable Wavelength [Square scanning field: 110x110mm; working distance: 151mm] | 10.6 μm |
| Scanning Field - Square [Square scanning field: 110x110mm; working distance: 151mm] | 110 mm × 110 mm |
| Scanning Field - Circular Diameter [Square scanning field: 110x110mm; working distance: 151mm] | φ156 |
| Working Distance [Square scanning field: 110x110mm; working distance: 151mm] | 151 mm |
| Incident Beam Diameter [Square scanning field: 110x110mm; working distance: 151mm] | 11 mm |
| Maximum Angle of Incidence [Square scanning field: 110x110mm; working distance: 151mm] | 25 ° |
| Distance from Galvanometer to Lens Center [Square scanning field: 110x110mm; working distance: 151mm] | 25 mm |
| Applicable Wavelength [Square scanning field: 110x110mm; working distance: 146mm] | 10.6 μm |
| Scanning Field - Square [Square scanning field: 110x110mm; working distance: 146mm] | 110 mm × 110 mm |
| Scanning Field - Circular Diameter [Square scanning field: 110x110mm; working distance: 146mm] | φ156 |
| Working Distance [Square scanning field: 110x110mm; working distance: 146mm] | 146 mm |
| Incident Beam Diameter [Square scanning field: 110x110mm; working distance: 146mm] | 14 mm |
| Maximum Angle of Incidence [Square scanning field: 110x110mm; working distance: 146mm] | 30 ° |
| Distance from Galvanometer to Lens Center [Square scanning field: 110x110mm; working distance: 146mm] | 23 mm |
| Applicable Wavelength [Square scanning field: 125x125mm; working distance: 175mm] | 10.6 μm |
| Scanning Field - Square [Square scanning field: 125x125mm; working distance: 175mm] | 125 mm × 125 mm |
| Scanning Field - Circular Diameter [Square scanning field: 125x125mm; working distance: 175mm] | φ177 |
| Working Distance [Square scanning field: 125x125mm; working distance: 175mm] | 175 mm |
| Incident Beam Diameter [Square scanning field: 125x125mm; working distance: 175mm] | 11 mm |
| Maximum Angle of Incidence [Square scanning field: 125x125mm; working distance: 175mm] | 25 ° |
| Distance from Galvanometer to Lens Center [Square scanning field: 125x125mm; working distance: 175mm] | 25 mm |
| Applicable Wavelength [Square scanning field: 175x175mm; working distance: 252mm] | 10.6 μm |
| Scanning Field - Square [Square scanning field: 175x175mm; working distance: 252mm] | 175 mm × 175 mm |
| Scanning Field - Circular Diameter [Square scanning field: 175x175mm; working distance: 252mm] | φ247 |
| Working Distance [Square scanning field: 175x175mm; working distance: 252mm] | 252 mm |
| Incident Beam Diameter [Square scanning field: 175x175mm; working distance: 252mm] | 11 mm |
| Maximum Angle of Incidence [Square scanning field: 175x175mm; working distance: 252mm] | 25 ° |
| Distance from Galvanometer to Lens Center [Square scanning field: 175x175mm; working distance: 252mm] | 25 mm |
| Applicable Wavelength [Square scanning field: 200x200mm; working distance: 294mm] | 10.6 μm |
| Scanning Field - Square [Square scanning field: 200x200mm; working distance: 294mm] | 200 mm × 200 mm |
| Scanning Field - Circular Diameter [Square scanning field: 200x200mm; working distance: 294mm] | φ283 |
| Working Distance [Square scanning field: 200x200mm; working distance: 294mm] | 294 mm |
| Incident Beam Diameter [Square scanning field: 200x200mm; working distance: 294mm] | 11 mm |
| Maximum Angle of Incidence [Square scanning field: 200x200mm; working distance: 294mm] | 25 ° |
| Distance from Galvanometer to Lens Center [Square scanning field: 200x200mm; working distance: 294mm] | 25 mm |
| Applicable Wavelength [Square scanning field: 250x250mm; working distance: 371mm] | 10.6 μm |
| Scanning Field - Square [Square scanning field: 250x250mm; working distance: 371mm] | 250 mm × 250 mm |
| Scanning Field - Circular Diameter [Square scanning field: 250x250mm; working distance: 371mm] | φ352 |
| Working Distance [Square scanning field: 250x250mm; working distance: 371mm] | 371 mm |
| Incident Beam Diameter [Square scanning field: 250x250mm; working distance: 371mm] | 11 mm |
| Maximum Angle of Incidence [Square scanning field: 250x250mm; working distance: 371mm] | 25 ° |
| Distance from Galvanometer to Lens Center [Square scanning field: 250x250mm; working distance: 371mm] | 25 mm |
| Applicable Wavelength [Square scanning field: 300x300mm; working distance: 447mm] | 10.6 μm |
| Scanning Field - Square [Square scanning field: 300x300mm; working distance: 447mm] | 300 mm × 300 mm |
| Scanning Field - Circular Diameter [Square scanning field: 300x300mm; working distance: 447mm] | φ424 |
| Working Distance [Square scanning field: 300x300mm; working distance: 447mm] | 447 mm |
| Incident Beam Diameter [Square scanning field: 300x300mm; working distance: 447mm] | 11 mm |
| Maximum Angle of Incidence [Square scanning field: 300x300mm; working distance: 447mm] | 25 ° |
| Distance from Galvanometer to Lens Center [Square scanning field: 300x300mm; working distance: 447mm] | 25 mm |
Key Features
Improves Peripheral-Ray Delivery to Detector;Adding a Field Lens Reduces Required Detector Area,or Expands FOV/Increases Flux with Same Detector;Frees Image-Plane Position for Modulator Disk;Uniformizes Detector Illumination;Flat-Field Lens Gives Flat Image Plane;Compensates Field Curvature/Distortion
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Supplier Information
Tongsheng Technology is dedicated to the research, production of precision optical nano-film devices and the application and promotion of automatic optical control systems. The core team consists of Ph.D. supervisors and Ph.D.s with renowned optical backgrounds, possessing advanced optical manufacturing technology. We have independently developed an intelligent optical online monitoring system and Filmaster film design software, and have been recognized as a major high-precision project in Beijing. Our products include filters, laser films, reflectors, lenses, etc., applied in aerospace, semiconductors, biomedicine, artificial intelligence, etc. We offer batch customization, adhering to the principles of integrity, technological innovation, and customer first.
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