VMP8000-high-frequency wafer production test system
Designed for high-frequency chips, the VMP8000 series tests 6-inch wafers containing lasers, detectors, or RF devices. High accuracy, speed, and stability support complete dynamic testing, including O-E/E-O/E-E bandwidth, eye diagrams, and RIN, alongside static LIV and spectral measurements. With Ketai Guangxin's in-house high-speed semiautomatic probing capabilities, the VMP8000 also serves efficient production CP testing.
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