VMP7000 - VCSEL wafer production test system
The VMP7000 semiautomatic VCSEL wafer production-test probe-stage series combines production efficiency, stability, and data requirements. Under DC or pulses of width ≥10us, it tests LIV, spectra, near- and far-field optics, reverse leakage current, and other characteristics. Ketai Guangxin added automatic loading/unloading for high-volume use to develop the fully automatic VMP7000-A VCSEL wafer production-test system.
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Overview
Specifications
| Parameter | Value |
|---|---|
| UPH [Typical settings, such as 11-point LIV; Original text states UPH can reach over 4000] | 4000 or above |
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