VMP9000 - narrow-pulse wafer production test system
The VMP9000 narrow-pulse VCSEL wafer production-test series is designed for VCSEL lidar applications. An in-house driver supplies pulses shorter than 100ns at currents above 35A at wafer level, enabling LIV, near-field, and far-field testing. The VMP9000-A flexibly integrates fully automatic loading and unloading to balance production accuracy and efficiency.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Drive pulse width [PDF product overview: Maximum 100ns/200ns, wafer-level drive] | 100/200 |
| Drive current [PDF product introduction] | 20 A |
| Pulse-current output capability [PDF high-power section; The same section also states maximum 100ns/200ns] | 20 or above |
| Maximum output voltage [PDF wide-range section] | 60 V |
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Datasheet
Supplier Information
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