STORM 2000SLH Large-sized base plate defective detection device

STORM 2000SLH Large-sized base plate defective detection device

Supplier
Vptek
Category
Semiconductor Manufacturing Equipment
Origin
China

STORM 2000SLH is a bug detection device developed by Whip for large-sized Mask, which applies to large-sized Mask-on-screen mapping defects, such as LCD, TFT, CF, Touch Panel.

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Overview

STORM 2000SLH is a bug detection device developed by Whip for large-sized Mask, which applies to large-sized Mask-on-screen mapping defects, such as LCD, TFT, CF, Touch Panel.

Applications

Provides an efficient surface deficiency detection programme to Mask of G8.5 and below to meet 0.5um capability for defects detection

Key Features

– Maximum support for 8.5 generation panel sizes – support for Loader to automatically go up and down, support for docking with AGV — support for DD, DB, SL testing models — support for dual optical head scans, greatly improves detection efficiency

Datasheet

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Supplier Information

VPTEK is a manufacturer of automated optical inspection equipment in the semiconductor manufacturing field. VPTEK's solutions can meet the demanding defect inspection requirements in semiconductor wafer and semiconductor mask manufacturing processes. The products are applied in pan-semiconductor, CMOS image sensor, MEMS and RF fields, serving industry-leading FABs, IDMs, OSATs and foundries. VPTEK adheres to the path of localization, independently develops key technologies, fills the gap in domestic high-end inspection equipment, and helps the development of China's integrated circuit industry. Guided by the innovative passion, years of concerted efforts and win-win cooperation of VPTEK people, VPTEK has become a rapidly growing semiconductor defect inspection equipment enterprise, winning the trust and support of many customers and suppliers.

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STORM 2000SLH Large-sized base plate defective detection device
Vptek · Semiconductor Manufacturing Equipment
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