Lambda Microscopic Hyperspectral Imaging Systems Lambda-Nir

Lambda Microscopic Hyperspectral Imaging Systems Lambda-Nir

Supplier
Championoptics
Part Number
Lambda-Nir
Category
Scientific & Industrial Cameras
Origin
China

Lambda microscopic hyperspectral imaging fits most commercial microscopes. An area detector, drive supply, motion control and acquisition modules are integrated without a motorized stage, greatly reducing size/weight for simple microscope operation. Applications include tumor-cell identification, hemorrhagic-polyps/fleshy-white-patch identification, lymphocytic-leukemia screening, cytoplasm/nucleus discrimination and cell counting. Darkfield excludes unrelated light from the objective, revealing clear outlines on a dark background; particles as small as 4~200nm can be seen, with resolution stated as 50 times ordinary brightfield. Hyperspectral microscopy identifies particle types. The figure uses VNIR imaging of mouse lung after a single low (18 pg) or high (162 pg) intratracheal titanium-dioxide nanoparticle dose to locate retained particles. Darkfield hyperspectral images show white-inclusion aggregates in the middle image; hyperspectral maps show red dots/aggregates below. Different eyepiece magnifications produce high-spatial-resolution OLED emission images, combining images/spectra to inspect uniformity/stability. Noncontact, nondamaging, rapid microregion measurement operates at room temperature or inline, obtaining whole-wafer PL Mapping for substrate/epilayer composition ratios, defects and other microregional uniformity. It identifies wafer materials and changes in emission-center concentration at fine scales. Compared with confocal imaging for perovskite inhomogeneity, advantages include single full-field imaging, uniform excitation intensity across the PL field and quantitative spectral intensity. Semiconductor uses include emission uniformity, defect analysis and spatial LED-chip temperature distributions. Additional cases from readable page text: rapid hyperspectral identification of laryngeal mucosal hemorrhagic polyps/fleshy-white-patch regions, shown red; tumor/abnormal-cell spread at 20-times eyepiece magnification; rapid nucleus/cytoplasm/other-material discrimination; counting by cell centroids, total 402; darkfield nanoparticle-exposed tissue, upper image; OLED emission at 20X,50X,100X; images/spectra of boron-implanted, aluminum-implanted and special unimplanted wafers; perovskite PL data: (a)/(b) are monochromatic images at 625nm/750nm, (c) spectra from different positions in Figure 1, (d) regional PL spectral-shift imaging; hyperspectral inversion of temperatures on different LED source panels.

Specification Snapshot
Spectral Resolution
20nm
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Overview

Lambda microscopic hyperspectral imaging fits most commercial microscopes. An area detector, drive supply, motion control and acquisition modules are integrated without a motorized stage, greatly reducing size/weight for simple microscope operation. Applications include tumor-cell identification, hemorrhagic-polyps/fleshy-white-patch identification, lymphocytic-leukemia screening, cytoplasm/nucleus discrimination and cell counting. Darkfield excludes unrelated light from the objective, revealing clear outlines on a dark background; particles as small as 4~200nm can be seen, with resolution stated as 50 times ordinary brightfield. Hyperspectral microscopy identifies particle types. The figure uses VNIR imaging of mouse lung after a single low (18 pg) or high (162 pg) intratracheal titanium-dioxide nanoparticle dose to locate retained particles. Darkfield hyperspectral images show white-inclusion aggregates in the middle image; hyperspectral maps show red dots/aggregates below. Different eyepiece magnifications produce high-spatial-resolution OLED emission images, combining images/spectra to inspect uniformity/stability. Noncontact, nondamaging, rapid microregion measurement operates at room temperature or inline, obtaining whole-wafer PL Mapping for substrate/epilayer composition ratios, defects and other microregional uniformity. It identifies wafer materials and changes in emission-center concentration at fine scales. Compared with confocal imaging for perovskite inhomogeneity, advantages include single full-field imaging, uniform excitation intensity across the PL field and quantitative spectral intensity. Semiconductor uses include emission uniformity, defect analysis and spatial LED-chip temperature distributions. Additional cases from readable page text: rapid hyperspectral identification of laryngeal mucosal hemorrhagic polyps/fleshy-white-patch regions, shown red; tumor/abnormal-cell spread at 20-times eyepiece magnification; rapid nucleus/cytoplasm/other-material discrimination; counting by cell centroids, total 402; darkfield nanoparticle-exposed tissue, upper image; OLED emission at 20X,50X,100X; images/spectra of boron-implanted, aluminum-implanted and special unimplanted wafers; perovskite PL data: (a)/(b) are monochromatic images at 625nm/750nm, (c) spectra from different positions in Figure 1, (d) regional PL spectral-shift imaging; hyperspectral inversion of temperatures on different LED source panels.

Specifications

ParameterValue
Spectral Range1150~1650±5nm
Spectral Resolution20nm
Number of Spectral Channels32/64
Standard Lens-Focal Length [Other optional focal lengths: 9mm, 15mm, 22mm, 56mm; inquire about other options]35 (other focal lengths optional)
Standard Lens-Working Distance300-∞
Standard Lens-Field of View15.6°
Detector640×512 InGaAs FPA
Pixel Count (Spatial Dimension × Scan Dimension)640×512
Pixel Size15 μm × 15 μm
Digital Output14bit
Frame Count10μs-1s
Built-in Computer InterfaceUSB3.0+HDMI
Lens MountC-Mount
System Power Supply [DC]DC 16.8V
Built-in MicroprocessorI7 processor, 16G RAM, 256G SSD
Built-in Battery65Wh
System Power Consumption60W

Applications

Biomedical applications; dark-field scattering nanoparticle detection; OLED display emission testing; wafer materials; defect detection; applications in perovskite crystals; applications in LED/OLED light-source displays

Key Features

Lens integration: directly integrates with standard C-mount imaging lenses or microscopes for rapid spectral-image (Mapping) acquisition. Automatic acquisition: supports automatic exposure, automatic scan-speed matching, and automatic data acquisition and saving. Real-time calibration and model calculations: more than 25 built-in index models, including water and vegetation models, support real-time data calibration and calculations. Auxiliary monitoring: an auxiliary viewfinding camera monitors the imaging area in real time. Built-in power: an internal battery supports standalone operation. Data correction: radiometric, reflectance and regional correction, lens calibration and uniformity calibration. Lens compatibility: lenses can be flexibly replaced. Software compatibility: data formats are fully compatible with Envi, SpecSight and other professional analysis software. Spectral matching search: real-time target spectral matching and search. Wireless remote control: built-in WiFi supports Android smartphones, iPad and iPhone. Remote transmission: Gigabit Ethernet supports long-distance image transmission and remote control.

Datasheet

Product Datasheet
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Supplier Information

Ch
Championoptics
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Changchun Champion Optics Technology Co., Ltd. (Champion Optics) was founded in 2019 as a spinoff from the Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, focusing on optical thin-film components, spectral instruments, and spectral image processing. Covering 6,000 m² with a 3,600 m² cleanroom, it possesses advanced coating and metrology equipment for full-spectrum precision coating. Main products include precision optical coatings and spectral instruments, featuring its proprietary patterned coating technology. Multispectral filters have been successfully deployed on satellites. It has resolved the bottleneck in space spectral filters, leading the domestic market. Serving aerospace, defense, semiconductor, medical, agriculture, and other sectors, Champion Optics is a leading system-level thin-film solution provider.

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