TDC Data Acquisition
The time-to-count controller precisely measures intervals between trigger events and converts time into digital counts. IDQ controllers include timestamp tagging, TCSPC, delay generation, filtering and counting modules. Combined with software, they support quantum communications, time-of-flight and fluorescence-lifetime measurements. Architecture: application functional block diagram; software interface.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Input channels [High Speed mode] | 4 + Start |
| Bin width [High Speed mode] | 100 ps |
| Time jitter (RMS) [High Speed mode；RMS] | <100 ps |
| Dead-time [High Speed mode] | <4 ns |
| Maximum processing rate (per channel) [High Speed mode；per channel] | 100 Mevents/s |
| Max input voltage range [High Speed mode] | -3 V |
| Output delay steps | 100 ps |
| Count rate | 1 GHz |
| Discriminator range | -2 to 2 V |
| Discriminator steps | 1 mV |
| Output channel number | 4 |
| Output pulse format | NIM or TTL |
| Output max frequency | 125 MHz |
| Output pulse min width (TTL) | 6 ns |
| Output pulse min width (NIM) | 1 ns |
| Maximum transfer rate to PC [* Hardware ready for 100 Mevent/s] | 10* |
| Maximum delay generation | typical:1 ms |
| Power Supply | 100-240V;1-2.5A; 50-60Hz |
| Operating conditions | 5°-40° ; 80% humidity up to 31°C and 50% up to 40°C |
| Applicable standards | Safety: EN 61010-1:2010, AMD1:2016 |
| Applicable standards | CSA C22.2 61010-1-12/UL 61010-1:2012 |
| Applicable standards | EMC: EN 61000-6-2:2005, EN 61000-6-3:2007+A1:2011 |
| Applicable standards | EN 61326-1:2013 |
| Input channels [High Resolution mode] | 4 |
| Bin width [High Resolution mode] | 13 ps |
| Time jitter (RMS) [High Resolution mode；RMS] | 8 ps |
| Dead-time [High Resolution mode] | 5 ns |
| Maximum processing rate (per channel) [High Resolution mode；per channel] | 25 Mevents/s |
| Max input voltage range [High Resolution mode] | 3 V |
Key Features
Datasheet
Supplier Information
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