Noncontact Spectrocolorimeters 10°光源分光测色仪
The noncontact spectrocolorimeter is a dual-angle spectral instrument for material reflectance and color measurement. Measurements under 10° and 45° illumination obtain both surface reflectance and color information for industrial quality inspection, color consistency control, and process monitoring. CIE standard illumination and a high-precision spectrometer form a single measurement focus where illumination and collection paths meet the sample. Built-in source-stability compensation reduces light-source variation for rapid, stable characterization.
Specification Snapshot
Spectral Range
400 ~ 700 nm
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Overview
The noncontact spectrocolorimeter is a dual-angle spectral instrument for material reflectance and color measurement. Measurements under 10° and 45° illumination obtain both surface reflectance and color information for industrial quality inspection, color consistency control, and process monitoring. CIE standard illumination and a high-precision spectrometer form a single measurement focus where illumination and collection paths meet the sample. Built-in source-stability compensation reduces light-source variation for rapid, stable characterization.
Specifications
| Parameter | Value |
|---|---|
| Illumination Angle | 10 ° |
| Spot Size | 1 ~ 3 mm |
| Spectral Range | 400 ~ 700 nm |
| Sample Type | Glass samples, specular or frosted |
| Sample Thickness | maximum 6mm |
| Sample Thickness [First surface] | First surface maximum thickness 0.5mm |
| Test Duration [Single point] | Single-point test time 0.2~0.5s |
| Calibration Reference Standard | Fully BK-7 polished glass |
| Spectral Reflectance Accuracy | better than ± 0.5% |
| Tristimulus (CIE 1931 X, Y, Z) Accuracy | better than ± 0.05 |
| Chroma (CIE 1931 X,Y) Accuracy | better than ± 0.005 |
| LAB Colors [CIE 1976 L*, a*, b*;L] | L ± 2.0 |
| LAB Colors [CIE 1976 L*, a*, b*;a*, b*] | a*, b* ± 0.8 |
| Average Reflectance | ± 0.2% |
| Spectral Data Output | R% vs. wavelength |
| Color Data Output | Tristimulus 1931 X,Y,Z Tristimulus 1964 X,Y,Z CIE 1931 x,y ,CIE 1976 L*, a*, b* CIE 1976 L*, u*, v* |
| Ambient Temperature | 0℃ ~ 35℃ |
| Humidity | <90% |
Applications
Measurement of various flat optical materials; mobile phone cover glass measurement; optical material measurement
Key Features
Custom modes support different measurement scenarios. Simple, intuitive software outputs reflectance and CIE chromaticity data for analysis. Fast measurement (<1s), external triggering, and synchronized dual-angle triggering simplify control. Real-time module-to-sample distance monitoring aids adjustment and measurement. Multiple mounting holes support integration and eliminate operator errors, with simple construction and low maintenance costs. NIM verification: meets verification by China's National Institute of Metrology; noncontact design prevents sample damage and contamination.
Datasheet
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Supplier Information
Shenzhen JPT Opto-electronics Co., Ltd. (Stock Code: 688025) is a national high-tech enterprise integrating R&D, production and sales of lasers, laser/optical intelligent equipment and fiber optic devices. Adhering to the 'Laser+' positioning, it deeply cultivates core laser technologies, deeply integrates AI to build an intelligent driving engine, continuously focuses on laser core modules and future optical connection solutions, and strives to create a 'Light+AI' integrated innovation ecosystem. Relying on its independent and controllable technology matrix, its strategic layout covers key core areas such as consumer electronics head customers, data centers, next-generation communication infrastructure, electric vehicle precision manufacturing, new energy lithium battery intelligent manufacturing, and information technology (AR/VR). Through fundamental technological innovation, it reshapes the value chain of the optoelectronics industry and provides full-scenario optical solutions for the intelligent era.
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