Near-Infrared-to-Mid-Infrared Acousto-Optic Modulators AOMO 3200-1913
AOMO 3200-1913 is a compact near-infrared-to-mid-infrared acousto-optic modulator using tellurium dioxide as the acousto-optic medium. Designed for telecommunications-wavelength laser systems and small-beam photonic assemblies, it provides high-speed optical switching, beam gating and precise intensity modulation. Fast response, high diffraction efficiency and stable acousto-optic interaction meet modulation-speed, beam-separation and integration-reliability requirements in compact infrared optical systems. The excellent acousto-optic properties of TeO₂ allow AOMO 3200-1913 to provide efficient, stable modulation from near-infrared to mid-infrared wavelengths, with distinct separation of diffracted and undiffracted beams. Low reflectance, high switching contrast and compact RF compatibility facilitate integration into space-constrained optical systems, providing repeatable, reliable modulation while maintaining beam quality. Applications include telecommunications photonics, optical test platforms, laboratory photonic systems, research laser equipment and OEM optical instruments, providing high-performance, highly stable beam control for high-speed infrared laser systems.
Overview
Specifications
| Parameter | Value |
|---|---|
| Applicable Wavelength Band | Near-Infrared-Mid-Infrared |
| Minimum Wavelength | 1320 nm |
| Maximum Wavelength | 1820 nm |
| Center Frequency | 200 MHz |
| Clear Aperture Dimension | 0.1 mm × 1 mm |
| Rise/Fall Time | 159 ns |
| Acousto-optic Medium | TeO₂ |
| Acoustic Velocity | 4.2 mm/μs |
| RF Bandwidth [-10 dB Return Loss] | 90 MHz(@ -10 dB Return Loss ) |
| Input Impedance | 50 Ω |
| Standing Wave Ratio | ≤ 1.3:1 |
| Insertion Loss | ≤ 4% |
| Single-Surface Reflectance | ≤ 0.5% |
| Antireflection Coating Standard | MIL-C-48497 |
| Optical Power Density | 50 MW/cm² |
| Extinction Ratio | ≥1000:1 |
| Polarization | At a 90° angle to the mounting plane |
| Saturation RF Power [Wavelength :1550 nm] | 3 W |
| Bragg Angle [Wavelength :1550 nm] | 36.9 mrad |
| Beam Separation Angle [Wavelength :1550 nm] | 73.8 mrad |
| Diffraction Efficiency [Beam Diameter :50 μm; Test Wavelength :1550 nm] | 50% |
| Rise Time [Beam Diameter :50 μm; Test Wavelength :1550 nm] | 10 ns |
| Diffraction Efficiency [Beam Diameter :65 μm; Test Wavelength :1550 nm] | 55% |
| Rise Time [Beam Diameter :65 μm; Test Wavelength :1550 nm] | 12 ns |
Key Features
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