Near-Infrared Acousto-Optic Modulator AOMO 3080-197
AOMO 3080-197 is a near-infrared acousto-optic modulator using tellurium dioxide as the acousto-optic medium. Designed for beam modulation and precise control in highly stable near-infrared laser systems, it provides reliable beam gating, optical switching and dynamic intensity modulation. High diffraction efficiency, low reflectance and high switching contrast meet optical-performance, switching-stability and long-term reliable-operation requirements in precision photonics platforms. The excellent acousto-optic properties of TeO₂ allow AOMO 3080-197 to provide efficient, stable beam interaction, combining good optical efficiency, beam-size accommodation and fast response. Heatsink-assisted construction improves thermal management and maintains stable modulation during continuous operation, serving applications requiring thermal stability and precise beam control. Applications include optical test platforms, research laser systems, laboratory photonics equipment, OEM optical instruments and other near-infrared laser applications, providing stable, reliable beam modulation and control for high-performance laser systems.
Overview
Specifications
| Parameter | Value |
|---|---|
| Applicable Wavelength Band | Near Infrared |
| Minimum Wavelength | 875 nm |
| Maximum Wavelength | 1250 nm |
| Center Frequency | 80 MHz |
| Clear Aperture Dimension | 1 mm × 2.5 mm |
| Rise/Fall Time | 159 ns |
| Acousto-optic Medium | TeO₂ |
| Acoustic Velocity | 4.2 mm/μs |
| RF Bandwidth [-10 dB Return Loss] | 30 MHz(@ -10 dB Return Loss ) |
| Input Impedance | 50 Ω |
| Standing Wave Ratio | maximum 1.3:1 |
| Insertion Loss | maximum 4% |
| Single-Surface Reflectance | maximum 0.5% |
| Antireflection Coating Standard | MIL-C-48497 |
| Optical Power Density | 50 MW/cm² |
| Extinction Ratio | ≥1000:1 |
| Polarization | At a 90° angle to the mounting plane |
| Saturation RF Power [Wavelength :1060 nm] | 1.5 W |
| Bragg Angle [Wavelength :1060 nm] | 10.1 mrad |
| Beam Separation Angle [Wavelength :1060 nm] | 20.22 mrad |
| Diffraction Efficiency [Beam Diameter :1000 μm; Test Wavelength :1060 nm] | 85% |
| Rise Time [Beam Diameter :1000 μm; Test Wavelength :1060 nm] | 153 ns |
| Diffraction Efficiency [Beam Diameter :500 μm; Test Wavelength :1060 nm] | 80% |
| Rise Time [Beam Diameter :500 μm; Test Wavelength :1060 nm] | 78 ns |
| Diffraction Efficiency [Beam Diameter :250 μm; Test Wavelength :1060 nm] | 70% |
| Rise Time [Beam Diameter :250 μm; Test Wavelength :1060 nm] | 41 ns |
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