Visible-Light Acousto-Optic Modulators AOMO 3200-192
AOMO 3200-192 is a compact visible-light acousto-optic modulator using tellurium dioxide as the acousto-optic medium. Designed for high-speed beam control in visible laser systems, it provides fast optical switching, precise beam modulation and pulse picking. Excellent diffraction efficiency, fast response and stable acousto-optic interaction meet beam-control accuracy, timing-stability and system-integration requirements in precision optical systems. The excellent acousto-optic properties of TeO₂ allow AOMO 3200-192 to provide efficient, stable beam gating, dynamic intensity modulation and precise timing control, delivering reliable high-speed modulation while maintaining beam quality. Its compact structure facilitates integration into space-constrained optical platforms, providing stable, highly repeatable beam control for visible laser systems. Applications include laser-scanning microscopy, optical imaging systems, analytical and inspection instruments, optical testing and measurement platforms, research-laboratory photonic systems and scientific laser platforms, providing high-performance, highly reliable beam modulation and control for visible-laser applications.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Saturation RF Power [Wavelength 458 nm] | 0.7 W |
| Bragg Angle [Wavelength 458 nm] | 10.9 mrad |
| Beam Separation Angle [Wavelength 458 nm] | 21.8 mrad |
| Saturation RF Power [Wavelength 532 nm] | 0.7 W |
| Bragg Angle [Wavelength 532 nm] | 12.7 mrad |
| Beam Separation Angle [Wavelength 532 nm] | 16.4 mrad |
| Saturation RF Power [Wavelength 690 nm] | 1.0 W |
| Bragg Angle [Wavelength 690 nm] | 25.4 mrad |
| Beam Separation Angle [Wavelength 690 nm] | 32.8 mrad |
| Diffraction Efficiency [Test Wavelength 690 nm; Beam Diameter 60 μm] | 65% |
| Rise Time [Test Wavelength 690 nm; Beam Diameter 60 μm] | 14 ns |
| Modulation Bandwidth [Test Wavelength 690 nm; Beam Diameter 60 μm] | 52 MHz |
| Beam Ellipticity [Test Wavelength 690 nm; Beam Diameter 60 μm] | 15 |
| Diffraction Efficiency [Test Wavelength 690 nm; Beam Diameter 80 μm] | 73% |
| Rise Time [Test Wavelength 690 nm; Beam Diameter 80 μm] | 17 ns |
| Modulation Bandwidth [Test Wavelength 690 nm; Beam Diameter 80 μm] | 40MHz |
| Beam Ellipticity [Test Wavelength 690 nm; Beam Diameter 80 μm] | 8 |
| Diffraction Efficiency [Test Wavelength 690 nm; Beam Diameter 100 μm] | 77% |
| Rise Time [Test Wavelength 690 nm; Beam Diameter 100 μm] | 20 ns |
| Modulation Bandwidth [Test Wavelength 690 nm; Beam Diameter 100 μm] | 31 MHz |
| Beam Ellipticity [Test Wavelength 690 nm; Beam Diameter 100 μm] | 4 |
| Diffraction Efficiency [Test Wavelength 690 nm; Beam Diameter 120 μm] | 80% |
| Rise Time [Test Wavelength 690 nm; Beam Diameter 120 μm] | 23 ns |
| Modulation Bandwidth [Test Wavelength 690 nm; Beam Diameter 120 μm] | 26.5 MHz |
| Beam Ellipticity [Test Wavelength 690 nm; Beam Diameter 120 μm] | 2 |
| Applicable Wavelength Band | Visible light, near-infrared light |
| Minimum Operating Wavelength | 450 nm |
| Maximum Operating Wavelength | 850 nm |
| Center Frequency | 200 MHz |
| Clear Aperture Dimension | 0.32 mm × 2.5 mm |
| Acousto-optic Medium | TeO₂ |
| Rise/Fall Time | 159 ns |
| Acoustic Velocity | 4.2 mm/μs |
| RF Bandwidth [-9 dB Return Loss] | 50 MHz(@ -9 dB Return Loss ) |
| Input Impedance | 50 Ω (rated value) |
| Standing Wave Ratio | ≤ 1.3:1 |
| Insertion Loss | ≤ 4% |
| Single-Surface Reflectance | ≤ 1% |
| Optical Power Density | 250 W/mm² |
| Extinction Ratio | ≥1000:1 |
| Polarization | At a 90° angle to the mounting plane |
Key Features
Datasheet
Supplier Information
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