Comprehensive Analytical Probe Stations SH-12
For testing samples up to 12 inches.
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Overview
For testing samples up to 12 inches.
Specifications
| Parameter | Value |
|---|---|
| External Form | 1300mm long *920mm wide *920mm high |
| Weight | Approximately 300 kilograms |
| Power Requirements | 220VC,50~60Hz |
| Sample Stage - Dimensions | 12 inches, rotatable through 360 degrees |
| Sample Stage - Travel | X-Y Travel 12 inches *12 inches |
| Sample Stage - Motion Accuracy | 1um |
| Sample Stage - Sample Holding Method | Vacuum suction |
| Sample Stage - Back-Electrode Testing Function | Yes; the sample stage is electrically isolated and floating |
| Probe-Holder Platform - Specifications | U-shaped platform, accommodates up to 12 needle holders |
| Probe-Holder Platform - Travel & Adjustment Method | The platform supports rapid lifting/lowering over 6mm travel with automatic locking, plus fine vertical adjustment over 25mm travel with 1um lifting accuracy |
| Optical Characteristics - Microscope Travel | X-Y axis travel 2 inches*2 inches; Z axis: 50.8mm |
| Optical Characteristics - Microscope Motion Accuracy | 1um |
| Optical Characteristics - Lens Switching Method | Rapid microscope tilt through 30 degrees |
| Optical Characteristics - Magnification | 20~4000X |
| Optical Characteristics - Lens Specifications | Eyepiece :10X; Objective :5X,10X,20X,50X,100X( Optional ) |
| Optical Characteristics - CCD Pixels | 50W (analog)/200W (digital)/500W (digital) |
| Point Probe Specifications - X-Y-Z Travel | 12mm-12mm-12mm/8mm-8mm-8mm |
| Point Probe Specifications - Mechanical Accuracy | 10 micrometers/2 micrometers/0.7 micrometers/0.1 micrometers |
| Point Probe Specifications - Leakage Accuracy | 10pA/100fA (with shielding enclosure) |
| Point Probe Specifications - Interface Type | Banana plug/alligator clip/coaxial/triaxial interfaces |
Applications
Wafer testing; optoelectronic device testing; PCB/packaged device testing; RF testing; high-voltage/high-current testing
Key Features
Stable structure; coaxial lead-screw drive for linear motion; probe-holder platform with rapid lifting/lowering and fine adjustment, suitable for probe-card testing; large-handle drive for comfortable operation with a backlash-free design; compatible with high-magnification metallurgical microscopes, with fine translation adjustment; internal chip circuit/electrode/PAD testing; use in university, research-institute and company laboratories; LD/LED/PD light-intensity/wavelength testing; sample testing up to 12 inches; IV/CV characterization of materials/devices
Datasheet
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Supplier Information
Shanghai Manji Optoelectronics was founded in 2018, a core supplier of microscopic imaging and laser processing equipment and overall solutions. We are deeply engaged in optical inspection and processing, with technological innovation as the core, providing high-precision customized optomechanical solutions. The company has a 1500㎡ R&D, production, sales and office integrated base in Shanghai, built a full-stack independent R&D and production system covering optics, mechanics, electronics and software. We have an independent AOI intelligent detection algorithm and interdisciplinary R&D team, achieving full control from core technology to system integration, providing deeply customized "turnkey" solutions to ensure high precision and reliability of equipment. Based on the frontier, we continue to expand. In 2025, we strategically deployed Dingyuan Biotechnology in Suzhou, focusing on R&D and production of biological live cell imaging equipment, improving cross-field layout and empowering biomedical research. In the future, Manji Optoelectronics will uphold the concept of "Mastering Precision with Light, Creating Innovation with Intelligence", working with partners to promote the progress of optical technology and industrial upgrading.
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