Automatic Isolator and Circulator Test System
Automatically tests and calculatesIL,PDL,RLin,RLout,ISO,CT,WDL,TDLand other parameters. Circulator testing supports individual devices,modules and chassis,with high/low-temperature tests and automatic delay control during temperature changes. Isolator testing handles four devices simultaneously and uses temperature-settling periods to improve throughput. Complex grading criteria are evaluated automatically for product sorting,and results are judged automatically. Data are stored inSQLServerfor high-capacity storage and automatic batch shipment reports.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Operating Wavelength | 1260 ~ 1620 nm |
| Test Specifications | IL/PDL/RL/DIR/CT/WDT//TDL,etc. |
| Insertion Loss (IL) Uncertainty [Fiber Splice Testing] | ±0.05 db |
| Insertion Loss (IL) Uncertainty [Connector Test] | ±0.1 db |
| PDLUncertainty | ±0.03 db |
| Measurement Mode | Point Light Source+Power Meter |
| Single-Channel Scan Time | 15 S |
| Net Single-Point PDL Measurement Time | 3-5 S |
| Measurable Product Types | Isolator/Circulator |
| Configured Tunable Light Source | 1250~1650nm |
| Configured Optical-Switch Repeatability [Optical Switch:1×2/1×4,Mechanical Test-Grade Optical Switch] | ≤0.01dB |
Datasheet
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