CWDM4/LWDM Scanning Test System
1. 支持Bar条测试，可与自动化耦合握手，耦合对光完成之后自动进行扫描测试。 2. 支持不同类型的CWDM4（MUX and DEMUX）以及100G Lan WDM器 Items的扫描 and 全3、带宽的PDL测试，Parameters设置灵活，界面可视化、操作非常简便。 3. 支持multiple工位对可调光源进行实时并行共享扫描测试，工位互不干扰，None需排队等待（Industry首创，百分百验证并有multiple家客户成功案例，每 complete plans工位扫描时间相同，并且申请了专利）。 4. 自动计算ITU IL、Min IL、Max IL、IL uniformity、Ripple、PDL、通道带宽 and 中心波长（1dB，3dB等）、Isolation、Slope、Crosstalk等Parameters。 5. 自动分析计算各种所需的测试Parameters结果 and 自动判定测试结果。 6. 失效Parameters自动区分并标识，使失效数据一目了然。 7. 系统软 Items兼容各种可调光源（Agilent，santec，uc等） and 各种带triggerFunction的功率计。
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Overview
Specifications
| Parameter | Value |
|---|---|
| Operating Wavelength | 1260 ~ 1360 nm |
| Test Specifications | IL/RIPPLE/PDL/ADJ/NADJ/CWL/BW/TDL/CROSSTALK |
| Insertion Loss [Connector Test] | ±0.1 db |
| Uncertainty [connector test] | ±0.1 db |
| Measurement Mode | Tunable Light Source+High-Speed Power Meter |
| Measurable Product Types | CWDM4(MUX/DEMUX),LAN-WDM,AWG |
Datasheet
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