Comprehensive Optical Coupler Test System
1. A single connection supports simultaneous full-bandwidth scanning and single-point IL, PDL, RL and DIR testing, including high- and low-temperature testing. 2. One broadband source and OSA spectrum analyzer are shared by four test channels, reducing hardware costs. 3. Compatible with 1X2, 2X2 and 1X4 couplers and WDM devices, with automatic testing and calculation of IL, WDL, PDL, RL, DIR, UL and TDL. 4. Automatic pass/fail evaluation; all data are stored in a SQL Server database, with automatic batch generation of shipment reports.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Operating Wavelength | 1260 ~ 1620 nm |
| Test Specifications | ITU IL/Min IL/Max IL/WDL/Ripple/TDL and Other Parameters |
| Insertion Loss (IL) Uncertainty [Fiber Splice Testing] | ±0.05 dB |
| Insertion Loss (IL) Uncertainty [Connector Test] | ±0.1 dB |
| Measurement Mode | OSW Scanning |
| Single-Channel Scan Time [AQ6370,1250–1650nm, Step0.1nm] | 6-8 s |
Datasheet
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