WDM Device Scanning Test System
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Specifications
| Parameter | Value |
|---|---|
| Operating Wavelength | 1260～1360/1520~1630 |
| Maximum Supported Station Count | 16 |
| Supported Power Meter Channel Counts per Station | 2/4/8/16/48/64 |
| Wavelength Resolution | 1 pm |
| Wavelength Accuracy | 5 pm |
| Light Source Scan Repeatability | 0.02 dB |
| Polarization-Dependent Loss Repeatability | 0.03 |
| Power Meter Measurement Linearity | 0.04dB (+3~-50dBm) 0.3dB (-50~-65dBm) |
| Insertion Loss Measurement Range | +10～-70 dBm |
| Measurement Uncertainty | 5% |
| Sweep Time | <12s @100nm Bandwidth with PDL Measurement; <6s @100nm Bandwidth without PDL Measurement |
| Communication Interface | Ethernet |
| Operating Power Supply | 110VAC/220VAC 50HZ |
| Operating Temperature | -10~+40 ℃ |
| Storage Temperature | -25~+70 ℃ |
| Dimensions | 300 mm × 340 mm × 160 mm |
Key Features
Datasheet
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Supplier Information
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