Three-temperature 800G BERT
The Lianxun Instruments 800G Optical Module Tester is an integrated BER test system combining an optical port bit error analyzer (BERT) and a three-temperature control unit. It integrates multiple bit error analyzers, multiple MCBs for optical modules under test, and multiple independent temperature control units, with no need for external RF cable interconnection. Through different thermal cycling settings, high-speed optical module bit error testing under different ambient temperature conditions is achieved; through the replaceable MCB test card design, no additional high-speed RF cables are needed, enabling flexible and fast plug-in testing of the DUT; by replacing the MCB test card and matching test fixtures, testing of optical modules in different package types can be achieved, mainly including 800G QSFP-DD, OSFP and other optical modules, and also compatible with 400G optical modules; test items include optical module bit error testing, FEC testing, transmitter calibration, DMI information monitoring, voltage and current measurement, voltage modulation (bias test), etc.; the temperature cycling compression box kit specially designed for the MCB test card supports TEC temperature cycling (no load: -10~+85 ℃, loaded module DMI temperature -5~+85 ℃); high-efficiency temperature cycling testing is achieved by configuring a high-cooling-capacity water chiller; the product's excellent signal quality (fast rise/fall times, low jitter), rich functions (supporting FEC error correction analysis), flexible option configuration, and extremely high overall integration provide strong performance and flexibility guarantees for the pre-research, design, and production testing of high-speed serial circuit products.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Pattern generator - Output type | Differential/Single-ended PAM4/NRZ |
| Pattern Generator-Module Port Count | 4 |
| Pattern generator - Termination | AC coupled |
| Pattern generator - Output impedance [±10%] | 100 Ω ±10 % |
| Pattern Generator-Data Pattern | PRBS 7/9/11/13/15/23/31, PRBS7~31Q; SSPRQ, JP03A, JP03B, LIN, square wave, custom patterns, etc. |
| Pattern Generator-Symbol Rate (Gbaud) [add-on option available, supports more extended rates below 48G] | 24.33/24.8832/25/25.78125/26.5625/27.89/27.95/28.05/28.125/28.2/28.9/48.66/49.7664/51.5625/53.125/56/56.25/56.4/57.8/58 Gbaud |
| Pattern generator - Frequency accuracy [typical] | ±50 ppm (typical) |
| Pattern Generator-Output Amplitude (Differential) [differential; typical; net measured value at transmitter, default pre-emphasis/de-emphasis parameters] | 750 mVp-p (typical) |
| Pattern Generator-Rise Time (20-80%) [20-80%; typical; measured with 53.125Gbps NRZ signal] | <10 ps (typical) |
| Pattern Generator-Fall Time (20-80%) [20-80%; typical; measured with 53.125Gbps NRZ signal] | <10 ps (typical) |
| Pattern Generator-Random Jitter (Random Jitter) [typical; random jitter measured after jitter separation] | <350 fs (typical) |
| Output Clock-Output Amplitude | >300 mVp-p |
| Output Clock-Output Type | AC-coupled, single-ended |
| Output Clock-Divider Ratio (configurable) | 4/8/16/32 |
| Output Clock-Trigger Output | Supports RF switch to toggle clock output |
| Error detector - Input type | Differential PAM4/NRZ |
| Error detector - Termination | AC-AC-coupled |
| Error detector - Input impedance [±10%] | 100 Ω ±10 % |
| Error Detector-Receive Amplitude (Differential) [differential; typical; module measured value, excessively high voltage input may damage the receiver] | 150~750 mVp-p (typical) |
| Error Detector-Receive Sensitivity (Differential) [differential; typical; module measured value, excessively high voltage input may damage the receiver] | 150 mVp-p (typical) |
| Error detector - Data pattern | PRBS 7/9/11/13/15/23/31,PRBS7~31Q |
| Error Detector-Symbol Rate (Gbaud) [add-on option available, supports extended rates below 48G] | 24.33/24.8832/25/25.78125/26.5625/27.89/27.95/28.05/28.125/28.2/28.9/48.66/49.7664/51.5625/53.125/56/56.25/56.4/57.8/58 Gbaud |
| Error detector - Clock mode | Built-in clock recovery |
| Error Detector-Synchronization Type | Automatic synchronization (level/phase) |
| Temperature Cycling-Temperature Control Method | Contact TEC temperature control |
| Temperature Cycling-Heating/Cooling Range | -5~+85 °C |
| Temperature Cycling-Stability | ±1 °C |
| Temperature Cycling-Temperature Control Accuracy | ±0.1 °C |
| Optical Module Bias Test-Output Range | 3.069~3.5 V |
| Optical Module Bias Test-Step Accuracy | 1 mV |
| Environment | For use in indoor facilities |
| Operating | Temperature: 0 °C to +55 °C; Humidity: 30 % to 80 % RH non-condensing |
| Storage | Temperature: -30 °C to 60 °C; Humidity: 10 % to 90 % RH non-condensing |
| Power Supply | Voltage range: 100-240VAC, Frequency range: 50/60 Hz, Maximum power: 800 W |
| Warm-up [After performing automatic calibration, ambient temperature change less than ±3°C] | After 30 minutes of warm-up and automatic calibration, ambient temperature change is less than ±3 °C |
| Dimensions | 171 mm × 585 mm × 442 mm |
| Main Unit Weight [typical] | 32 kg (typical) |
Key Features
Datasheet
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