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NanoCalc thin film reflectance measurement system (NC-NIR-HR)
Spectrometers

NanoCalc thin film reflectance measurement system (NC-NIR-HR)

Supplier
Gzbiaoqi
Part Number
NC-NIR-HR
Category
Spectrometers
Origin
China

The optical properties of thin films mainly include reflection and interference. The NanoCalc thin-film reflection measurement system can be used for film thickness analysis and measurement from 10 nm to 250 µm, with a resolution of 0.1 nm for single-layer films. Depending on the measurement software, single-layer or multi-layer film thickness can be analyzed. The two most commonly used methods for measuring thin-film properties are optical reflection and transmission measurement, and ellipsometry measurement. NanoCalc uses the reflection principle for film thickness measurement. Up to three layers of thin films can be measured, and the film and substrate to be measured can be metal, dielectric, amorphous material, or silicon crystal, etc. The NanoCalc software includes an n and k value database for most materials, and users can also add and edit their own.

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Overview

The optical properties of thin films mainly include reflection and interference. The NanoCalc thin-film reflection measurement system can be used for film thickness analysis and measurement from 10 nm to 250 µm, with a resolution of 0.1 nm for single-layer films. Depending on the measurement software, single-layer or multi-layer film thickness can be analyzed. The two most commonly used methods for measuring thin-film properties are optical reflection and transmission measurement, and ellipsometry measurement. NanoCalc uses the reflection principle for film thickness measurement. Up to three layers of thin films can be measured, and the film and substrate to be measured can be metal, dielectric, amorphous material, or silicon crystal, etc. The NanoCalc software includes an n and k value database for most materials, and users can also add and edit their own.

Specifications

ParameterValue
Thickness70 nm-70µm
Light sourceHalogen lamp
Angle of Incidence90 °
Number of layers3 layers or less
Reference value measurement requiredYes
Transparent materialsYes
Transmission modeYes
Rough materialsYes
Measurement Speed100 ms - 1 s
Online monitoringYes
Tolerance (Height)Reference measurement or collimation (74-UV)
Tolerance (Angle)Reference measurement
Micro blackbody optionWith microscope
Display optionWith microscope
Positioning option6" and 12" XYZ positioning stage
VacuumYes

Applications

The NanoCalc thin-film reflection material system is suitable for online film thickness and removal rate measurement, including oxide layers, silicon nitride films, photographic film, and other types of thin films. NanoCalc can also measure anti-reflection coatings, anti-wear coatings, etc. on materials such as steel, aluminum, copper, ceramics, and plastics.

Key Features

Can analyze single-layer or multi-layer films; resolution up to 0.1 nm; suitable for online monitoring

Datasheet

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Supplier Information

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Gzbiaoqi
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Guangzhou Biaoqi Optoelectronics Technology Development Co., Ltd. was founded in 2005 and is an enterprise founded by leading entrepreneurial talents in Guangzhou Development District. It is a national high-tech enterprise and a national specialized and sophisticated "little giant" enterprise focusing on spectral rapid detection system integration and instrument development. The company integrates design, R&D, manufacturing, sales, and after-sales service, with spectral rapid detection and analysis technology as its core. Through high-speed acquisition, processing, and algorithm analysis of spectral data, it provides rapid, non-destructive, online, fully automatic detection equipment and high-end quality inspection and analysis solutions for various industries. Biaoqi Optoelectronics has established the Guangdong Provincial Engineering Technology Research Center for Rapid Spectral Measurement. Its products cover many fields such as optical component inspection, semiconductors, new energy vehicles, environmental monitoring, solar photovoltaics, new materials, biology, optoelectronics, and chemicals. Relying on strong independent R&D capabilities and independent demonstrative diversified operational advantages, Biaoqi Optoelectronics has achieved rapid development in recent years and is a leader in the domestic spectral rapid detection application industry. It has obtained numerous qualifications and honors, including national specialized and sophisticated "little giant" enterprise, national high-tech enterprise, Guangdong Province specialized and sophisticated enterprise, Guangdong Province intellectual property demonstration enterprise, and Guangzhou Development District gazelle enterprise. Under the guidance of its core corporate values of "prudent thinking, earnest practice, innovation, and win-win", Biaoqi Optoelectronics continuously accumulates experience, builds a domestic independent brand, and customizes spectral detection application solutions for customers, developing spectral rapid detection and analysis instruments suitable for different application fields. These include the optical component inspection industry: optical component spectral sorting instruments, reflectance spectral analyzers, transmittance spectral analyzers, etc.; the jewelry identification industry: UV-visible spectral analyzers (jewelry detectors), jewelry luminescence imaging analyzers, etc.; and the scientific research field: quantum efficiency spectral analysis systems, portable Raman spectral analyzers, photoluminescence spectral analyzers, etc. Biaoqi Optoelectronics' non-destructive rapid spectral analyzers have significant advantages, featuring high efficiency, speed, and accuracy, which can help users greatly improve detection efficiency and assist the high-quality development of application industries. At the same time, Biaoqi Optoelectronics is the South China general agent for Ocean Optics, the inventor of micro fiber optic spectrometers, an internationally renowned enterprise. With the rapid development of science and technology, Biaoqi Optoelectronics keeps pace with technological progress and the development of the times, forging ahead on the road of rapid spectral detection, striving for perfection.

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