Chip testing machine
The CT820X bare Die semiconductor laser chip test system integrates DUTID scanning, wafer ring loading, transportation, high-temperature testing, low-temperature testing, unloading, and sorting. Supports forward and reverse optical and electrical characteristic measurements. Supports multi-temperature-zone test stages, covering high, low, and room temperature parallel testing. CT820X is a very fast system. It can complete the entire process flow within 5.5~6s.
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Overview
The CT820X bare Die semiconductor laser chip test system integrates DUTID scanning, wafer ring loading, transportation, high-temperature testing, low-temperature testing, unloading, and sorting. Supports forward and reverse optical and electrical characteristic measurements. Supports multi-temperature-zone test stages, covering high, low, and room temperature parallel testing. CT820X is a very fast system. It can complete the entire process flow within 5.5~6s.
Key Features
Highly integrated bare Die semiconductor laser testing solution; the system automatically completes everything from scanning, loading, LIV, spectral testing, unloading, and sorting; through calibration steps, it automatically completes secondary positioning of finished products; automatic probe pin pressing with adjustable pressure; supports multiple temperature-zone carriers with very stable temperature control; the test carrier uses high-thermal-conductivity and high-wear-resistance materials for a longer service life; automatic sorting after testing; all moving mechanical devices can independently return to position; data is saved to a database for customers to query very conveniently, with interface support available; automatic alarms and notifications help operators handle problems; collimating fibers and large-area photodetectors automatically switch between scanning and spectral measurement, and also support automatic switching between forward or backward optical testing
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Supplier Information
Chengdu Xunsu Xinyuan Technology Co., Ltd., established in 2018, focuses on optical communication and microwave RF fields, providing optical test instruments, wafer/chip testing equipment, domestic microwave photonic devices, and process and packaging equipment. Products include laser noise analyzers, linewidth test systems, RIN testers, probe stations, chip testers, etc., serving the R&D and production of the optoelectronics industry. The company has its own packaging and testing laboratory and has obtained certifications such as National High-tech Enterprise, Gazelle Enterprise, and Sichuan Province Specialized and Sophisticated Enterprise.
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