E-LIT semiconductor component ( ) inspection system
Semiconductor, Device, Package Chip. “ ”, Chip Package, Density, (Lock-in Thermography), Device, Power, Current, ( ), InfraTec E-LIT Semiconductor Device ( ) Semiconductor Device ( ). Infrared, Infrared, E-LIT, Semiconductor, mk uK, x, y. Chip, Chip, Package Device, Module, E-LIT mK uK
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Overview
Specifications
| Parameter | Value |
|---|---|
| Detector | (1280×720), (640×512) infrared pixels |
| Spectrum Range | (2 .. 5) μm |
| Optical Lens Specification | 25mm, Close-up camera, Micro1x，3x，8x（Optional） |
| Options | X/YTwo-axis shift、Offset ReconciliationZAxis Slider、Automatic electric focus、Sensor Model |
| The cabinet | Including computers for system manipulation and data measurement and analysis,Divisional power supply |
Key Features
Datasheet
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