Photochip DIE laser calibration LUV2321
Designed for a single DIE in a crystal circle; allows for the achievement of super-low word clear marking; locates with precision and process clean dust; supports the marking of both sides of the crystal circle; balances high precision with high productivity; and meets the PV semiconductor's DIE level retrospective needs
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Overview
Specifications
| Parameter | Value |
|---|---|
| Equipment model | LUV2321 |
| Light | Green light/UV; nanos/ps |
| Up and down | Full automatic/manual |
| Process performance | min: 50μm |
Applications
Key Features
Datasheet
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