Isolator, Circulator automatic test system
Product Function Introduction 1. Automatically tests and calculates IL, PDL, RLin, RLout, ISO, CT, WDL, TDL and other parameters. 2. Circulator compatible devices and modules\chassis scan testing. Supports high/low temperature testing with automatic time delay control for heating and cooling. 3. Isolator supports testing 4 devices simultaneously, using high/low temperature waiting time to improve test capacity and efficiency. 4. Automatically judges various complex grades for product grade selection. 5. Automatically judges test results; all data is stored in bulk in the SQL Server database, and shipping reports are automatically generated in batches. Test Interface Diagram System Performance Specifications Parameter Specification Unit Min Typ Max Operating wavelength 1260 1620 nm Test indicators IL/PDL/RL/DIR/CT/WDT//TDL, etc. Insertion loss (IL) uncertainty ±0.05 (fiber splicing test) dB ±0.1 (connector test) PDL uncertainty ±0.03 dB Measurement mode Point light source + power meter Single-channel scan time 15 S Single-point PDL pure test time 3-5 S Measurable product types Isolator/Circulator Solution configuration: No. Name, specification and description Remarks 1 Tunable light source 1250~1650nm 2 Optical power meter, PDL polarization controller 3 Optical switch: 1X2, 1X4, mechanical test-grade optical switch Repeatability ≤0.01dB 5 Test system optical path host Custom 6 Test industrial computer 7 GPIB card, GPIB cable: PCI-GPIB, GPIB-US-HS
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Overview
Specifications
| Parameter | Value |
|---|---|
| Remarks | Repeatability ≤0.01dB Repeatability ≤0.01dB |
| Test Specifications | IL/PDL/RL/DIR/CT/WDT//TDL,etc. |
| Insertion Loss (IL) Uncertainty | ±0.05 (fusion splice test); ±0.1 (connector test) |
| PDL Uncertainty | ±0.03dB |
| Single-Channel Scan Time | 15s |
| Single-Point PDL Pure Measurement Time | 3-5s |
| Measurable Product Types | Isolator/Circulator |
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