CWDM4
Function Introduction 1. Supports Bar testing and can interface with automated coupling; after coupling and alignment are completed, scanning tests are performed automatically. 2. Supports scanning of different types of CWDM4 (MUX and DEMUX) and 100G Lan WDM devices, as well as full-bandwidth PDL testing. Parameter settings are flexible, with a visualized interface and very simple operation. 3. Supports real-time parallel shared scanning tests of tunable light sources across multiple stations; stations do not interfere with each other and there is no queue waiting (industry first, 100% verified with successful cases from multiple customers; each station has the same scan time and a patent has been applied for). 4. Automatically calculates ITU IL, Min IL, Max IL, IL uniformity, Ripple, PDL, channel bandwidth and center wavelength (1 dB, 3 dB, etc.), Isolation, Slope, Crosstalk, and other parameters. 5. Automatically analyzes and calculates the results of various required test parameters and automatically determines the test results. 6. Failed parameters are automatically distinguished and marked, making failed data clear at a glance. 7. The system software is compatible with various tunable light sources (Agilent, santec, uc, etc.) and various power meters with trigger functions. Test Interface Schematic System Performance Specifications Parameter Specification Unit Min. Typical Max. Operating wavelength 1260 1360 nm Test specifications IL/RIPPLE/PDL/ADJ/NADJ/CWL/BW/TDL/CROSSTALK Insertion loss ±0.1 (connector test) dB Uncertainty ±0.1 (connector test) Measurement mode Tunable light source + high-speed power meter Measurable product types CWDM4(MUX/DEMUX), LAN-WDM, AWG
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Overview
Specifications
| Parameter | Value |
|---|---|
| Test Specifications | IL/RIPPLE/PDL/ADJ/NADJ/CWL/BW/TDL/CROSSTALK |
| Insertion Loss | ±0.1 (connector test) |
| Measurable Product Types | CWDM4(MUX/DEMUX); LAN-WDM; AWG |
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