Thin Film Thickness Measurement Instrument AF Series

Thin Film Thickness Measurement Instrument AF Series

Supplier
Atometrics
Category
Optical Metrology
Origin
China

Precise deviation correction for ultra-high resolution; millisecond-level sampling frequency, 2~3 times faster than traditional film thickness meters, more suitable for online use! Supports Mapping mode with automatic fast measurement, single-point time <0.5 s, compatible with 2-12 inch wafers.

Request a Quote Download Datasheet
Save to Favorites Save to Favorites

Overview

Precise deviation correction for ultra-high resolution; millisecond-level sampling frequency, 2~3 times faster than traditional film thickness meters, more suitable for online use! Supports Mapping mode with automatic fast measurement, single-point time <0.5 s, compatible with 2-12 inch wafers.

Specifications

ParameterValue
Single-Point Measurement Time<0.5s
Applicable Wafer SizeCompatible with 2-12 inch wafers

Applications

Transparent films, semi-transparent films, multilayer film thickness; application examples: film thickness SiO2-film thickness photoresist-film thickness microchannel-film thickness finished film-film thickness PI film-film thickness glass bonding-film thickness ITO-film thickness perovskite-film thickness.

Datasheet

Please provide your email to download the datasheet.

Your name
Email Address

Invalid email format. Please try again.

Send Request

Supplier Information

At
Atometrics
View Supplier →
Banshi Intelligent Technology (Shenzhen) Co., Ltd., a national-level specialized and sophisticated "Little Giant" and high-tech enterprise, focuses on providing precision measuring instruments and semiconductor metrology equipment to global customers. Currently, Banshi Intelligent provides stable and reliable services to many well-known enterprises such as Huawei HiSilicon, CATL, II-VI, Accelink, Bozhon, Chinese Academy of Sciences, AT&S, Shennan Circuits, Kinwong, and Huatian Technology. With the mission of "Exploring the future of humanity with precision measurement" and the vision of "Becoming a leader in precision measurement", Banshi Intelligent will continue to innovate in the fields of precision measurement and semiconductor metrology, redefining the connotation of "Intelligent Manufacturing in China" with product technology, and contributing Banshi's strength to the rise of Chinese instruments. Atometrics · Detection with Heart A brand under Banshi Intelligent "Atometrics" has launched multiple high-precision measurement products such as white light interferometers, flash testers, ultra-depth-of-field microscopes, line laser sensors, point laser sensors, spectral confocal displacement sensors, line spectral displacement sensors, wafer 3D metrology, and packaging substrate 3D automatic inspection equipment. They have been widely used in semiconductors, aerospace, 3C electronics, 5G communications, new energy, biomedical and other fields. Providing customers with high-quality products and services is our unremitting pursuit. Our team of world's top scientists and experienced engineers is a key advantage to ensure customer success.

Request a Quote

Our team responds within 24–48 hours
Thin Film Thickness Measurement Instrument AF Series
Atometrics · Optical Metrology
Direct from Manufacturer
Your inquiry will be sent directly to the manufacturer
Photonics Source Platform
We handles the inquiry on your behalf
Your information is protected and will never be shared without consent.
Contact Us

Loading...

GetExperimental Plan

Name

Phone

+86

Organization

Use Case

AI Parametric Selection
Smart Match · Precise Recs
Enter Specifications
AI Smart Matching
Get Best Matches
Skip Manual Comparison
Find Best Solutions Fast
Select Now →