Thin Film Thickness Measurement Instrument AF Series
Precise deviation correction for ultra-high resolution; millisecond-level sampling frequency, 2~3 times faster than traditional film thickness meters, more suitable for online use! Supports Mapping mode with automatic fast measurement, single-point time <0.5 s, compatible with 2-12 inch wafers.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Single-Point Measurement Time | ＜0.5s |
| Applicable Wafer Size | Compatible with 2-12 inch wafers |
Applications
Datasheet
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Supplier Information
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