Wafer 3D Metrology Equipment WPM Series

Wafer 3D Metrology Equipment WPM Series

Supplier
Atometrics
Category
Semiconductor Packaging Equipment
Origin
China

White-light interferometry, spectral reflectance and chromatic confocal in one! Programmed measurement: intelligent arrays, automatic measurement, autofocus, automatic positioning, Data Feedback database management; High ease of use, automatic retesting, data statistical analysis with more analysis functions, one-click report generation; More functions: lean manufacturing modules such as data statistical analysis support customized development.; 01 Rich measurement functions Roughness/film thickness/step height/critical dimensions/Warpage/Bow/Stress/; 02 Ultra-high measurement accuracy Profile repeatability 0.03 nm Step height accuracy 0.3% XY maximum repeatability 0.19μm; 03 Ultra-high inspection efficiency Ultra-fast scanning speed: 5 times that of conventional models Fully automatic measurement: online programming settings, automatic measurement Offline analysis: original data can be secondarily analyzed for specific purposes

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Overview

White-light interferometry, spectral reflectance and chromatic confocal in one! Programmed measurement: intelligent arrays, automatic measurement, autofocus, automatic positioning, Data Feedback database management; High ease of use, automatic retesting, data statistical analysis with more analysis functions, one-click report generation; More functions: lean manufacturing modules such as data statistical analysis support customized development.; 01 Rich measurement functions Roughness/film thickness/step height/critical dimensions/Warpage/Bow/Stress/; 02 Ultra-high measurement accuracy Profile repeatability 0.03 nm Step height accuracy 0.3% XY maximum repeatability 0.19μm; 03 Ultra-high inspection efficiency Ultra-fast scanning speed: 5 times that of conventional models Fully automatic measurement: online programming settings, automatic measurement Offline analysis: original data can be secondarily analyzed for specific purposes

Specifications

ParameterValue
Topography Repeatability0.03nm
Step Height Accuracy0.3%
XY Maximum Repeatability0.19μm

Applications

RDL, Bump, CD, EBR, Overlay, TSV, RST, film thickness; application examples: 3D topography Wafer Warp/Bow/TTV/Stress CMP-surface profile; 3D dimensions CD/RDL/EBR-width; film thickness plasma film-thickness; step height Pilar/RDL-height

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Supplier Information

At
Atometrics
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Banshi Intelligent Technology (Shenzhen) Co., Ltd. (brand: Atometrics) was established in 2017, headquartered in Shenzhen. It is a national-level specialized and sophisticated 'Little Giant' enterprise and a high-tech enterprise, focusing on high-precision measuring instruments and semiconductor metrology and inspection equipment. The company has launched various high-precision measurement products such as white light interferometers, flash measuring instruments, super depth-of-field microscopes, laser sensors, spectral confocal sensors, wafer 3D metrology equipment, etc., which are widely used in semiconductors, aerospace, 3C electronics, 5G communication, new energy, biomedical and other fields. Major customers include Huawei HiSilicon, CATL, Chinese Academy of Sciences, and other well-known enterprises, committed to exploring the future of humanity with precision measurement.

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Wafer 3D Metrology Equipment WPM Series
Atometrics · Semiconductor Packaging Equipment
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