G520D-YF33

The JW18001-CWDM test system is professional testing equipment for CWDM devices, and is a new generation of precision optical testing instrument developed by Jiahui Company by combining many years of optical device testing experience. The JW18001-CWDM test system is equipped with 18 point light sources | 18 optical switches | 19 power meters, and is configured with powerful application software to meet relevant testing requirements. The software performs insertion loss, return loss, adjacent isolation, non-adjacent isolation and other tests on the device under test, and judges whether it meets the product design requirements according to preset thresholds. In line with the requirements of Industry 4.0, it enables expansion of functions such as test automation, data analysis management, and data interconnection with users' factory and enterprise information management platforms.

The 3D white light module is the "binocular" of the endoscope system. Through parallel dual optical channels, it simulates human eye parallax, providing surgeons with a real surgical field of view with depth and stereoscopic perception on the display, and is the basis for completing precise dissection, suturing, and other operations.

The structured light optical sectioning microscope improves optical resolution by using specific illumination patterns, surpassing the diffraction limit of traditional fluorescence microscopes. It enables fast and gentle optical sectioning 3D imaging, significantly reducing fluorescence interference from out-of-focus planes as well as autofluorescence from specimens and culture media, obtaining clearer and more realistic sample images and making your research more diverse.

The core advantage of this product lies in the complete optical isolation between the light source plane and the sample plane, which differs from the drawback of ordinary illumination that directly projects the light source onto the sample surface: the system separately controls the illumination field of view and the illumination beam angle through independent optical paths, and the light source image is focused at the objective aperture position rather than on the surface of the measured sample. The sample only receives uniform parallel incident light, and the brightness imperfections of the light source itself will not appear in the imaging picture, ensuring a clean image with no spots and no dark corners at the edges throughout.