High-Power COS Test Machine
The High Power COS Testing Machine is a fully enclosed, integrated test platform designed for comprehensive characterization of high-power laser diode COS (Chip on Submount) devices, including pump lasers and industrial lasers. It combines a precision CW & Pulse current source (0~3A / 0~1A) with optical power measurement, spectrum analysis (600~1700nm), far-field scanning, polarization extinction ratio (PER) testing, and TEC-based temperature control (20~100℃) in a single sealed chamber with a settable test environment temperature of 0~100℃. The machine supports LIV, PER, spectrum and far-field tests in one station, and its test fixtures are fully compatible with burn-in machines, enabling seamless process flow from device testing to aging.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Output Mode | CW & Pulse |
| Output Current Accuracy | 0.05%+1.5mA(@3A) |
| Output Current Resolution | <0.01mA |
| Optical Power Measurement Range | <5W |
| Optical Power Measurement Accuracy | ±0.001mW |
| Spectrum Measurement Wavelength Range | 600~1700nm |
| Far-field Scan Range | ±40° / ±70° |
| Far-field Scan Resolution | 0.05° |
| Polarization Extinction Ratio Scan Range | 360° |
| Polarization Extinction Ratio Wavelength Range | 450~1000 / 620~1000 |
| Temperature Control Method | TEC |
| Temperature Control Range | 20~100℃（低温受热功率影响） |
| Temperature Accuracy | ±1℃ |
| Temperature Stability | 0.1℃ |
| Test Environment Temperature | 0~100℃ |
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