WDF File Access Library
The WDF File Access Library is a free API (Application Program Interface) provided as a DLL (Dynamic Link Library) that enables user applications on a Windows PC to acquire data from waveform data files (WDF) saved on Yokogawa measurement instruments. By linking the DLL, developers can build application software with functions such as getting measuring conditions and getting waveform data from recorded WDF files accessible over the PC storage environment. Dedicated DLLs are provided for waveform data saved with the DL850E series, DL350, DL950, SL2000, Yokogawa's Xviewer software, and the DLM3000, DLM3000HD, DLM5000 and DLM5000HD series. The library offers functions for getting measuring date/time, measuring trace (channel) information, measuring points, time data/measuring data, units of the time axis/measuring axis, and resolutions of the time axis/measuring axis. The software package includes the library body (DLL), DLL import library (.lib), the prototype declaration header file (WDFAPIPublic.h), and sample code for explicit DLL linking (WDFAPIWrapper.cpp).
Save to Favorites
Overview
Specifications
| Parameter | Value |
|---|---|
| Product Type | API software library (Dynamic Link Library, DLL) |
| Supported File Format | WDF (waveform data file saved on Yokogawa measurement instruments) |
| Supported Operating System | Windows 10 (32 bit or 64 bit) / Windows 11, English or Japanese version |
| Application Development Environment | Visual Studio 2017 or later |
| Runtime Requirement | Visual Studio 2017 Redistributable Package |
| License | Free of charge |
| Software Package Files | ****.dll (library body); ****.lib (DLL import library); WDFAPIPublic.h (header file of prototype declaration); WDFAPIWrapper.cpp (sample code by explicit DLL linking) |
| DLL Types | DL850E.dll, DL350.dll, DL950.dll, SL2000.dll, XVWDF.dll, DLM3000.dll, DLM3000HD.dll, DLM5000.dll, DLM5000HD.dll |
| Applicable Instruments-DL850E.dll | DL850E series |
| Applicable Instruments-DL350.dll | DL350 |
| Applicable Instruments-DL950.dll | DL950 |
| Applicable Instruments-SL2000.dll | SL2000 |
| Applicable Instruments-XVWDF.dll | Yokogawa's Xviewer software |
| Applicable Instruments-DLM3000.dll | DLM3000 series |
| Applicable Instruments-DLM3000HD.dll | DLM3000HD series |
| Applicable Instruments-DLM5000.dll | DLM5000 series |
| Applicable Instruments-DLM5000HD.dll | DLM5000HD series |
| Main Functions | Getting measuring date/time; getting measuring trace (channel) information; getting measuring points; getting time data/measuring data; getting units of time axis/measuring axis; getting resolutions of time axis/measuring axis |
| Total Number of API Functions | 23 |
| Handle Create/Discard APIs | WdfOpenFileEx |
| Handle Create/Discard APIs | WdfOpenFile |
| Handle Create/Discard APIs | WdfCloseFile |
| Trace Information APIs | WdfGetTraceNumber |
| Trace Information APIs | WdfGetTraceName |
| Trace Information APIs | WdfGetLogicBitName |
| Trace Information APIs | WdfGetTraceBlockNumber |
| Waveform Accompanying Information APIs | WdfGetVDataType |
| Waveform Accompanying Information APIs | WdfGetVOffset |
| Waveform Accompanying Information APIs | WdfGetVResolution |
| Waveform Accompanying Information APIs | WdfIsEnabledVIllegalData |
| Waveform Accompanying Information APIs | WdfGetVIllegalData |
| Waveform Accompanying Information APIs | WdfGetVUnit |
| Waveform Accompanying Information APIs | WdfGetHOffset |
| Waveform Accompanying Information APIs | WdfGetHResolution |
| Waveform Accompanying Information APIs | WdfGetHUnit |
| Waveform Accompanying Information APIs | WdfGetDate |
| Waveform Accompanying Information APIs | WdfGetTime |
| Waveform Data Acquisition APIs | WdfGetBlockSize, WdfGetBlockSize64, WdfGetScaleWave, WdfGetScaleWave64 |
| API Return Type | WDFResult (typedef INT); WDF_OK = 0 (success), other values = error |
| Error Codes (WDFResultKind) | WDF_ERR, WDF_ERR_Error, WDF_ERR_InvalidHandle, WDF_ERR_InvalidParameter, WDF_ERR_Open, WDF_ERR_Alloc, WDF_ERR_FileAccess, WDF_ERR_NotDualCap, WDF_ERR_UnknownVersion, WDF_ERR_UnknownFormat, WDF_ERR_ParamBoundary, WDF_ERR_DataValue, WDF_ERR_CantReadDataType |
| WdfOpenFileEx Format | WDFResult WdfOpenFileEx(WDFHandle* handle, const char* fileName, WDFOpenMode mode) |
| WdfOpenFileEx Return Values | WDF_OK / WDF_ERR_Open / WDF_ERR_Alloc / WDF_ERR_FileAccess / WDF_ERR_UnknownFormat / WDF_ERR_DataValue / WDF_ERR_CantReadDataType |
| Handle Type | WDFHandle (typedef HANDLE) |
| Trace Number Type | WDFTrace (typedef UINT); zero-origin, valid range 0 to N-1 |
| History Block Number Type | WDFHistoryBlock (typedef UINT); 0 = earliest, N-1 = latest |
| Waveform Data Parameter Type | WDFDataParameter (typedef double) |
| Waveform Data Points Type | WDFDataBlock (typedef INT) / WDFDataBlock64 (typedef INT64) |
| Logic Bit Index Type | WDFBitIndex (typedef INT) |
| Open Mode Type | WDFOpenMode (typedef UINT32) |
| Open Mode Values (WDFOpenModeKind) | wdfOpenModeNormal |
| Open Mode Values (WDFOpenModeKind) | wdfOpenModeDualCapture |
| Waveform Data Block Types (WDFVDataType) | wdfDataTypeUINT16, wdfDataTypeSINT16, wdfDataTypeLOGIC16, wdfDataTypeUINT32, wdfDataTypeSINT32, wdfDataTypeLOGIC32, wdfDataTypeFLOAT |
| Acquired Waveform Data Parameter Structure (WDFAccessParam) | version, trace, block, start, count, ppRate, waveType, dataType, cntOut, dst, box, compMode, rsv1-rsv4 |
| Acquired Waveform Data Parameter Structure (WDFAccessParam64) | version, trace, block, start (INT64), count (INT64), ppRate (INT64), waveType, dataType, cntOut (INT64), dst, box, compMode, rsv1-rsv4 |
| Boolean Type | WDFBool (typedef BOOL); TRUE or FALSE |
| Trace Name Buffer Size (MAX_WDF_TRACE_NAME) | 16+1 |
| Logic Bit Name Buffer Size (MAX_WDF_BIT_NAME) | 16+1 |
| Vertical Axis Unit Buffer Size (MAX_WDF_V_UNIT) | 16+1 |
| Horizontal Axis Unit Buffer Size (MAX_WDF_H_UNIT) | 16+1 |
| Date Buffer Size (MAX_WDF_DATE) | 32+1 |
| Time Buffer Size (MAX_WDF_TIME) | 32+1 |
| WdfOpenFileEx Support (DL850E/DL350/DL950/SL2000 DLLs-XVWDF.dll-DLM series DLLs) | Y-Y-N |
| WdfOpenFile Support (DL850E/DL350/DL950/SL2000 DLLs-XVWDF.dll-DLM series DLLs) | N-N-Y |
| 64-bit Waveform API Support (DL850E/DL350/DL950/SL2000 DLLs) | Supported (WdfGetBlockSize64, WdfGetScaleWave64) |
| 64-bit Waveform API Support (XVWDF.dll) | Supported (WdfGetBlockSize64, WdfGetScaleWave64) |
| 64-bit Waveform API Support (DLM3000/DLM3000HD/DLM5000/DLM5000HD DLLs) | Not supported (use WdfGetBlockSize, WdfGetScaleWave) |
| WdfIsEnabledVIllegalData Support | DL850E/DL350/DL950/SL2000 DLLs only (not supported by XVWDF.dll and DLM series DLLs) |
| Large File Support | HD Recording with file divide or >2Gbytes: specify head file (ex. HOGE_000.WDF) |
| Version Compatibility | Cannot load WDF files of newer version than the software |
| Document Number | IM B8074XP-01EN |
| Document Edition | 9th Edition (May 2025) |
Applications
Key Features
Datasheet
Supplier Information
Related Products
-
Electro-Optic Q-Switch Pockels Cell Module
Other
Yokogawa
Crystal Material: KD*P/BBO Operating Wavelength Range: 300-1100nm Clear Aperture: 8mm×8mm
The Electro-Optic Q-Switch Pockels Cell Module is a fast optical switching device based on the linear electro-optic (Pockels) effect in a nonlinear crystal. As shown in the drawing, the device is packaged in a compact rectangular metal housing with a large, clear optical aperture and a side-mounted high-voltage electrical connector, allowing convenient integration into a laser cavity. When a high-voltage pulse is applied, the crystal induces a controlled phase retardation of the transmitted polarized beam; in combination with intracavity polarizers, the module acts as an ultrafast intracavity loss switch. It is widely used for Q-switching of solid-state lasers, cavity dumping, pulse picking and regenerative amplifier injection/ejection. Key characteristics include low half-wave voltage, high extinction ratio, high optical transmission, nanosecond-level switching speed and high laser damage threshold, making it suitable for industrial, medical, scientific and LiDAR laser systems. Note: the source material contains only a product outline drawing without a written datasheet; the specifications listed are typical values for this product class and should be confirmed against the manufacturer's official datasheet.
-
Laser Photoplotter Photosensitive Film Roll
Other
Yokogawa
Product Form: Roll Packaging Method: Black light-tight sealed bag Core Type: Cardboard core
The product shown is a roll of light-sensitive (photosensitive) recording film, supplied together with a black light-tight protective bag. The film is wound on a standard cardboard core in roll form, with a smooth, uniformly coated white/ivory surface. Because the emulsion is sensitive to light, the roll is packaged in an opaque black sealed bag to prevent exposure during storage and transportation. This type of film is designed for high-resolution laser imaging equipment such as laser photoplotters, imagesetters and phototypesetters, where a laser beam scans the film surface to record fine circuit patterns, text or graphics. After laser exposure, the film is developed to produce high-contrast, high-density images used as phototools or film positives in PCB fabrication and printing plate making.
-
Optical Rail System with Adjustable Optical Mounts
Other
Yokogawa
Number of Adjustable Optical Mounts: 4 Number of Central Optical Units: 1 Rail Layout: Linear, dual-section (left/right of central unit)
Based on the provided image, the product is a linear optical rail (optical bench) system consisting of a long rail base, four adjustable optical mounts with vertical posts arranged on both sides of the rail, and a central enclosed optical unit with a multi-slot housing. The rail structure allows optical components such as lenses, mirrors or filters to be positioned precisely along a common optical axis. Note: the source image is severely degraded (high-threshold silhouette) and no text, brand or detailed specifications are legible; the extraction is therefore based on the visible mechanical structure of the product.
-
Rack-Mounted Optoelectronic Test and Measurement System
Other
Yokogawa
System Architecture: Floor-standing standardized instrument rack with integrated multi-layer modules Control Computer: Top-mounted desktop workstation with monitor and keyboard Upper Measurement Module: Analysis/measurement instrument with integrated display and front-panel controls
The product shown is a floor-standing, rack-mounted optoelectronic test and measurement platform. The system integrates multiple instruments into a single standardized cabinet: an upper measurement/analysis module with an integrated display, a middle layer containing benchtop instruments (a display/readout unit and a source or control unit), and a high-power lower module with a front-panel ventilation grille, which indicates forced-air cooling for driving or testing high-power devices. A dedicated computer workstation (monitor and keyboard) is mounted on top of the cabinet for system control, data acquisition and analysis. The whole rack is supported by leveling feet for stable laboratory or production-floor installation. Please note: the provided image contains no legible brand name, model number or numerical technical data; the description and parameters below are therefore based on the visible system configuration, and detailed electrical/optical specifications should be confirmed with the manufacturer's official datasheet.
Related Articles
VCSEL, short for Vertical Cavity Surface Emitting Laser, is a widely used semiconductor laser component in modern optoelectronics. Unlike traditional edge-emitting lasers, VCSEL emits laser light vertically from its chip surface. Thanks to its low power consumption, stable beam quality, low cost, and easy integration, it has become the core light source for 3D sensing, wearable devices, and high-speed optical communication.
Founded in Beijing in 2011, Beijing FJR Opto-electronic Technology Co., Ltd. specializes in R&D, manufacturing and sales of infrared thermal imaging equipment and complete optoelectronic systems.
In photonics and laser technology, devices that manipulate optical signals via the electro-optic effect form the backbone of precision optical systems. Electro-optic phase modulators and electro-optic deflectors are two prominent examples of this device category. As a critical hardware solution for high-speed, high-accuracy laser beam direction control, electro-optic deflectors are widely deployed across industrial and research settings. Below is a detailed overview of their core structure, key performance drivers, and primary use cases.
Founded in 2019, Jilin JC Ultrafast Equipment Co., Ltd. is a high-tech enterprise incubated by the Ultrafast Optoelectronics Center of Jilin University. Our R&D team owns 15 years of profound experience in femtosecond laser micro-nano fabrication.
Loading...
Name
Phone
Organization
Use Case
Database Platform