Swept Test System
The Swept Test System is designed for optical component testing and provides a complete solution, including loss analysis, high-resolution analysis, and high-precision calibration standards. It is equipped with tunable lasers (TSL-775, TSL-570), multi-port optical power meters (MPM-220), polarization controllers (PCU-110), and dedicated control software to form a high-speed swept test system optimized for WDL/PDL measurement, suitable for R&D and production environments.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Absolute Wavelength Accuracy TypeA | ±12pm |
| Absolute Wavelength Accuracy TypeC | ±2.5pm |
| Absolute Wavelength Accuracy TypeP | ±1.0pm |
| Relative Wavelength Accuracy TypeA | ±12pm |
| Relative Wavelength Accuracy TypeC | ±3.0pm |
| Relative Wavelength Accuracy TypeP | ±1.3pm |
| Wavelength Repeatability TypeA | ±6pm |
| Wavelength Repeatability TypeC | ±2.0pm |
| Wavelength Repeatability TypeP | ±1.1pm |
| Scan Speed | 1-200nm/s |
| Dynamic Range | 40dB (MPM-211, -212, -217), 70dB (MPM-215) |
| Second Scan Dynamic Range | 75dB |
| PDL Dynamic Range | 0-5dB |
| IL/PDL Measurement Time | 3s@100nm/s, 1.8s@200nm/s |
| Resolution | 0.1nm or 0.01nm |
| IL Accuracy | ±0.02dB |
| IL Stability | ±0.1dB |
| IL Resolution | 0.001dB |
| PDL Accuracy | ±0.02dB + 3% of PDL |
| PDL Stability | ±0.15dB + 3% of PDL |
| PDL Resolution | 0.001dB |
| Operating Temperature | 15-35°C |
| Storage Temperature | <80°C |
Applications
Key Features
Datasheet
Supplier Information
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