TITAN™ Multi-Contact Probe
The TITAN™ Multi-Contact Probe is an advanced RF probing technology designed for the characterization of RF ICs. It features up to 15 contacts that can be individually configured for RF, logic signal, and bypass power supply. This probe offers excellent impedance matching, unique tip visibility, and a wide temperature range, making it ideal for testing high-speed digital circuits and modern multi-stage PAs.
Specification Snapshot
Lifetime
>1,000,000 touchdowns
Standard RF Return Loss
10dB
Recommended IC Pad Size
Minimum width and length vary based on pitch and number of contacts, ranging from 25μm×20μm to 70μm×40μm
Request a Quote
Download Datasheet
Chat
Overview
The TITAN™ Multi-Contact Probe is an advanced RF probing technology designed for the characterization of RF ICs. It features up to 15 contacts that can be individually configured for RF, logic signal, and bypass power supply. This probe offers excellent impedance matching, unique tip visibility, and a wide temperature range, making it ideal for testing high-speed digital circuits and modern multi-stage PAs.
Specifications
| Parameter | Value |
|---|---|
| Number of contacts | 3-15 |
| Pitch | 50μm to 150μm, 25μm step; 150μm to 300μm, 50μm step |
| Temperature Range | -40 to 150°C |
| Contact width | 20μm |
| Quadrant compatible | Yes |
| ShieldEnvironment™ compatible | Yes |
| Recommended overtravel | 25μm |
| Contact Resistance | <45mΩ |
| Lifetime | >1,000,000 touchdowns |
| Types of contact | G (Ground), S (RF signal 6GHz), L (Logic signal 500MHz), P (Bypass power DC), X (No contact) |
| Series Resistance | S: 0.2Ω (without cable assembly), 0.7Ω (with cable assembly); L: 0.2Ω (without cable assembly), 0.4Ω (with cable assembly); P: 0.2Ω (without cable assembly), 0.4Ω (with cable assembly) |
| Standard RF Insertion Loss | 3dB (without cable assembly), 5dB (with cable assembly) |
| Standard RF Return Loss | 10dB |
| Bandwidth for Logic & Nonstandard RF | L (any): 500MHz (without cable assembly), 70MHz (with cable assembly); S without adjacent G: 500MHz |
| Isolation | SGS: 20dB (50μm to 150μm pitch), 25dB (200μm to 300μm pitch); SS: 15dB |
| Bypass Power | GPG, G+P+G: 6Ω, 0.4nH; GP, G+P: 7Ω, 0.7nH |
| Open Resistance Between Adjacent Lines | Standard Edition: S-G: 100MΩ, S-S: 100MΩ, L-G: 100MΩ, L-L: 100MΩ, P-G: 100MΩ, P-P: 100MΩ; Low Leakage Premium Edition: S-G: 20GΩ (0.3s-3s), 100GΩ (after 30s); S-S: 20GΩ (0.3s-3s), 100GΩ (after 30s); L-G: 20GΩ (0.3s-3s), 200GΩ (after 30s); L-L: 20GΩ (0.3s-3s), 200GΩ (after 30s); P-G: 1GΩ (0.3s-3s), 15GΩ (after 30s); P-P: 1GΩ (0.3s-3s), 100GΩ (after 30s) |
| Dimensions | 39.9mm×28.7mm×6.0mm |
| Recommended IC Pad Size | Minimum width and length vary based on pitch and number of contacts, ranging from 25μm×20μm to 70μm×40μm |
Applications
1. Characterization of RF ICs 2. Testing high-speed digital circuits 3. Power supply and control of modern multi-stage PAs 4. Probing of pads as small as 30μm×25μm 5. Characterization of large ICs in ShieldEnvironment™
Key Features
1. Perfectly match RF channels with TITAN™ MEMS contacts 2. Unique tip visibility for ease of use on small DUT pads 3. Accurate test results for wireless RF ICs and high-speed digital circuits 4. Contact resistance <45mΩ for consistent test results 5. Characterization of large ICs in ShieldEnvironment™ 6. Over 1 million touchdowns on Al pads 7. Built-to-order for flexibility and short lead time
Datasheet
Product Datasheet
PDF
Supplier Information
<p>Yingbo Scientific Instruments (Shanghai) Co., Ltd. is an enterprise focused on providing comprehensive solutions for semiconductor wafer-level testing systems, micro-nano science and other fields. It mainly provides advanced semiconductor testing systems and micro-nano scientific instruments and equipment to universities, scientific research institutes and enterprises and institutions, and is committed to bringing scientific research products with market prospects to the market.</p><p><br></p><p><br></p><p> At present, the company has become one of the few domestic companies that provides professional scientific instruments such as semiconductor wafer-level testing systems and micro-nano processing. In the fields of semiconductor wafer-level testing system solutions, micro-nano processing equipment, micro-nano characterization equipment, micro-nano field consumables, micro-nano processing and testing, micro-nano peripheral products and other related fields, the company has an experienced and highly skilled team that can excellently complete all-round services before, during and after sales. The company is headquartered in Shanghai, and has offices in Beijing and Shenzhen. It has established 8 after-sales service outlets in Wuhan, Xi'an, Chengdu, Hefei, Shenyang, Nanjing, Xiamen, Xuzhou and other places. The outlets across the country provide customers with a large number of high-quality equipment and after-sales services, and have won a good reputation and reputation in the semiconductor technology service industry.</p><p><br></p><p> The company adheres to the value concepts of innovation, integrity, professionalism and efficiency, and provides high-quality equipment and technical services to partners. In the future, the company will continue to recommend the introduction of innovative and efficient product instruments and contribute a small amount to the development of the motherland's semiconductor science industry!</p>
Contact Us
Loading...
GetExperimental Plan
Name
Phone
+86
Organization
Use Case

Global Photonics Products
Database Platform
Database Platform
With 16 years of experience, we provide high-quality products and services to universities, research institutes, and industry.
50+ Detailed Categories · 3,000+ Global Brands · 100,000+ Photonics Products
1 Million+
In-depth analysis of professional academic resources in photonics
300,000
ProductsDatasheets Available Free
We will keep your personal information strictly confidential.
Product Quote
+86
* Select the quoting party:
By submitting, you agree to the User Service Agreement and Privacy Policy