Long-Wave Infrared Test Chart

Long-Wave Infrared Test Chart

Supplier
ColorSpace
Part Number
Long-Wave Infrared Test Chart
Category
Calibration Standards
Origin
China

The Long-Wave Infrared Test Chart is designed for evaluating the performance of long-wave infrared imaging systems. It features a grid pattern that allows for precise testing and calibration of imaging devices.

Specification Snapshot
Dimensions
Customizable
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Overview

The Long-Wave Infrared Test Chart is designed for evaluating the performance of long-wave infrared imaging systems. It features a grid pattern that allows for precise testing and calibration of imaging devices.

Specifications

ParameterValue
Grid SizeStandard
MaterialHigh-quality infrared-compatible material
Wavelength RangeLong-wave infrared spectrum
DimensionsCustomizable
ThicknessStandard or customizable

Applications

1. Long-wave infrared imaging system testing 2. Calibration of infrared cameras 3. Performance evaluation of thermal imaging devices

Key Features

1. High precision grid pattern for accurate testing 2. Durable and infrared-compatible material 3. Customizable dimensions for various applications

Datasheet

Product Datasheet
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Supplier Information

Co
ColorSpace
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<p>Beijing Zhengyin Technology Co., Ltd., founded in 2011, is based in the field of optical image and continues to create value for customers. Zhengyin Technology focuses on the imaging quality of optical images, providing one-stop image quality laboratory Turnkey solutions, automated test solutions, image test and optimization services for consumer electronics (mobile phones, tablets, etc.), security surveillance, automotive imaging (ADAS, CMS, DMS, etc.), medical imaging (endoscopes, capsule cameras, etc.), industrial vision, aerospace and other industries, covering optical imaging laboratory solutions, software and hardware solutions, technical consulting and training, various precision instruments, and test charts.</p>

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