NOVA-2000-LN
The NOVA-2000-LN is a high-performance defect inspection system designed for precise and efficient detection of defects in various materials.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Inspection Speed | Up to 200 wafers/hour |
| Defect Detection Size | Down to 0.1 µm |
| Supported Wafer Sizes | 200mm, 300mm |
| Defect Classification | Automated |
| Resolution | High resolution imaging |
| Interface | User-friendly touchscreen |
| Power Supply | 220V, 50Hz |
| Dimensions | 2000mm x 1500mm x 1800mm |
| Weight | 1200kg |
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Supplier Information
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