SPEC7000 High-Precision Rapid Spectral Analysis System
Specification Snapshot
Slit Width [Optional]
20um/50um/70/150 Available
Wavelength Measurement Range
350nm~850nm
Wavelength Accuracy
±0.3nm
Operating Mode
Pulsed Testing Supported
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Specifications
| Parameter | Value |
|---|---|
| Detector Specifications | Hamamatsu S10420S (14*2048 Pixels) |
| Optical Table | Plane Grating, Focal Length 140mm |
| Signal-to-Noise Ratio | 500:1 |
| Stray Light | <0.8% |
| Integration Time | 0.1ms~1200ms |
| Slit Width [Optional] | 20um/50um/70/150 Available |
| Wavelength Measurement Range | 350nm~850nm |
| Wavelength Accuracy | ±0.3nm |
| Wavelength Stability | ±0.1nm |
| Luminous-Flux Measurement Range [Configure a Suitable Integrating Sphere] | 0.01lm-10000 lm (Configure a Suitable Integrating Sphere) |
| Luminous-Flux Linearity | 0.5% |
| Luminous-Flux Test Accuracy | 1.50% |
| Luminous-Flux Measurement Stability | ±0.8% |
| Chromaticity-Coordinate Accuracy | ±0.002 |
| Chromaticity-Coordinate Repeatability | ±0.0010 |
| Color-Temperature Measurement Range | 1500K~25000K |
| Color-Temperature Accuracy [Under Standard Illuminant A] | ±10K (Under Standard Illuminant A) |
| Color-Rendering-Index Measurement Range | R1~R15,0~100.0 |
| Color-Rendering-Index Measurement Error | Ra:±1.0; CRI:±1.0 |
| Operating Mode | Pulsed Testing Supported |
Applications
LED Chips; Finished Light Sources; Standard Quality Inspection Engineering Machine Applications; Flash Testing; Laboratory High-Precision Spectral Analysis System
Key Features
High-Performance Back-Illuminated Area CCD(Hamamatsu S10420S);Multistage Spectral Splitting Reduces Stray Light;Precision Thermostat for Low Temperature Drift;Shutter for Real-Time Zeroing;Unique FPGA Gives Nanosecond CCD Timing to Improve Photometric Accuracy;Millisecond Testing;Wide Linear Dynamic Range;Extremely Sensitive CCD;Low Stray Light
Datasheet
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Supplier Information
Hangzhou Jingfei Technology Co., Ltd. (Jingfei Technology) was founded in 2008, is a leading supplier of miniature fiber optic spectrometers and optical testing solutions in China. As a national high-tech enterprise and a specialized and sophisticated SME in Zhejiang Province, the company focuses on independent R&D and innovation in spectral analysis technology, holding multiple invention patents, utility model patents, and software copyrights. Its products are widely used in optical inspection, energy and environmental protection, biomedicine, food safety, agricultural science, industrial manufacturing, etc. In LED spectral binning market, it holds over 85% market share, achieving import substitution; in thin-film thickness measurement, its high-precision spectrometers have become key equipment in photovoltaic and display panel production lines; in semiconductor manufacturing, its spectral detection technology is applied in wafer fabrication and packaging testing. The company's FLA series miniature fiber optic spectrometers have reached international advanced levels. Jingfei Technology adheres to the concept of 'innovation-driven development', continuously enhancing the core competitiveness of domestic scientific instruments, and promoting the development of the national instrument industry.
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