enAF 400kHz 2.5x EO-IM-LS250-002
The enAF 400kHz 2.5x autofocus system was designed by Envision using autofocus-switch and image-contrast technology. It uses laser triangulation, supports 400kHz line-scan cameras and 2.5× zoom, and precisely measures object distance from spot displacement. This is converted in real time into lens-drive commands for fast, precise focusing. The system offers non-contact operation, fast response, and strong interference resistance without dependence on image texture. It is suitable for high-speed line-scan inspection of displays, silicon wafers, PCBs, and films.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Series | enAF 400kHz |
| Scanning Speed | 800 mm/s |
| Maximum Tracking Error | 4 μm |
| Minimum Depth of Field (DOF) | ±6.0 μm |
| Optical Magnification | 2.5x |
| Focusing Range | 40 mm |
| Slope | 20µm/50mm |
| Camera Model | Linea HS 16K 400kHz |
| Lens Model | LS 2.5x |
| PC Interface | Ethernet |
| Motion | Single-Axis Motion |
| Camera Type | Linear Array |
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