X-Ray Optoelectronic Test System
Specification Snapshot
Tube Voltage [X-Ray Source]
90 kV
Operating Voltage [X-Ray Source]
40~90 kV
Operating Current [X-Ray Source]
10~200 μA
Maximum Output Power [X-Ray Source]
8 W
Pixel Size [X-Ray Detector]
49.5 μm
Pixel Matrix [X-Ray Detector]
1172×1100
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Specifications
| Parameter | Value |
|---|---|
| Tube Voltage [X-Ray Source] | 90 kV |
| Operating Voltage [X-Ray Source] | 40~90 kV |
| Operating Current [X-Ray Source] | 10~200 μA |
| Maximum Output Power [X-Ray Source] | 8 W |
| Type [X-Ray Detector] | CMOS Detector |
| Pixel Size [X-Ray Detector] | 49.5 μm |
| Pixel Matrix [X-Ray Detector] | 1172×1100 |
| Field of View [X-Ray Detector] | 58 mm × 54 mm |
| Resolution [X-Ray Detector] | 10.1 Lp/mm |
| Image Frame Rate [X-Ray Detector; 1×1] | 30 fps |
| A/D Conversion Bit Count [X-Ray Detector] | 14 bits |
| Spectral Range [Spectrometer] | 350~1100 nm |
| Pixel [Spectrometer] | 1024×58 (1044×64 Total Pixels) |
| Slit [Spectrometer; One of the Options, Replaceable Design] | 25/50/100 |
| Signal-to-Noise Ratio [Spectrometer; Full Signal] | 1000:1 |
| Dark Noise [Spectrometer] | 3 RMS counts |
| Integration Time [Spectrometer] | 8ms~60min |
| Fiber Core Diameter [Optical Fiber] | 600 μm |
| Wavelength Range [Optical Fiber] | 350~2000 nm |
| Interface [Optical Fiber] | SMA905 |
| Measurement Speed [Upgrade Option - Electrical Test Accessory - Source Meter] | 1M Samples/Second |
| Current [Upgrade Option - Electrical Test Accessory - Source Meter] | 10nA~7A DC, 10A Pulsed |
| Voltage [Upgrade Option - Electrical Test Accessory - Source Meter] | 200mV~200V |
| Power [Upgrade Option - Electrical Test Accessory - Source Meter] | 100W DC-1000W Pulsed |
| Leakage Accuracy [Upgrade Option - Electrical Test Accessory - Probe Fixture] | <100 fA |
| Maximum Withstand Voltage [Upgrade Option - Electrical Test Accessory - Probe Fixture] | 1000 V |
| Maximum Tolerable Current [Upgrade Option - Electrical Test Accessory - Probe Fixture] | 10 A |
| Cable [Upgrade Option - Electrical Test Accessory - Probe Fixture] | Double-Shielded Triaxial Cable |
| Needle-Shaft Length [Upgrade Option - Electrical Test Accessory - Probe] | 38 mm |
| Needle-Shaft Diameter [Upgrade Option - Electrical Test Accessory - Probe] | 0.5 mm |
| Needle-Tip Diameter [Upgrade Option—Electrical Test Accessories—Probe; Optional] | 1、2、5、10、20、50、100 |
| Measurable Current Range [Upgrade Option - Electrical Test Accessory - Probe] | 1fA~1A |
| Material [Upgrade Option - Electrical Test Accessory - Probe] | Tungsten |
Key Features
XRF Testing;Direct/Indirect X-Ray Detector Optoelectrical Testing;X-Ray Imaging(<3 Inches);X-Ray Transmission
Datasheet
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Supplier Information
Starting from basic and simple optical spectroscopy and imaging modules to multi-functional and complex spectroscopy and imaging system solutions, Dowell Photonics has been committed to providing customized, personalized services and experiences. With exquisite technology, we design clever and flexible optical modules, making your experimental testing, R&D, and production no longer limited by instrument functions. We help you build, expand, and upgrade multi-functional spectroscopic testing systems to meet your special needs!
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