Laser Confocal Photocurrent Imaging System
The photocurrent-imaging system visualizes photocurrent in new micro/nanoscale optoelectronic semiconductor devices. It reveals relationships between microstructure and optoelectronic properties, providing information on defects and carrier distribution, transport and recombination. Position-dependent chip photocurrent enables calculation of carrier distributions and diffusion lengths. Combining tunable spectra with micro-area photocurrent studies supports mechanism research and process optimization, guiding device design and performance improvement.
Specification Snapshot
Light Source [Any Wavelength Available as Required]
190~2100nm Supercontinuum,Halogen,Xenon,etc.;375,405,532,635,808,1530nm,etc.
Light Source Coupling
Fiber or Free-Space Optical Path
Amplification Factor [Optional Microscope]
5X, 10X, 20X, 50X, 100X, etc.
Resolution [Optional for Microscope; 405nm]
~200 nm
Maximum Scanning Pixel Count [Fast Scanning Module]
2000 pix × 2000 pix
Spectral Range [Spectrometer]
200~1700 nm
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Overview
The photocurrent-imaging system visualizes photocurrent in new micro/nanoscale optoelectronic semiconductor devices. It reveals relationships between microstructure and optoelectronic properties, providing information on defects and carrier distribution, transport and recombination. Position-dependent chip photocurrent enables calculation of carrier distributions and diffusion lengths. Combining tunable spectra with micro-area photocurrent studies supports mechanism research and process optimization, guiding device design and performance improvement.
Specifications
| Parameter | Value |
|---|---|
| Light Source [Any Wavelength Available as Required] | 190~2100nm Supercontinuum,Halogen,Xenon,etc.;375,405,532,635,808,1530nm,etc. |
| Light Source Coupling | Fiber or Free-Space Optical Path |
| Numerical Aperture NA [Optional Microscope] | 0.75、1.0、1.4 |
| Amplification Factor [Optional Microscope] | 5X, 10X, 20X, 50X, 100X, etc. |
| Microscope Options | Long Working Distance Available, Multiple Manufacturers Available |
| Resolution [Optional for Microscope; 405nm] | ~200 nm |
| Maximum Scanning Pixel Count [Fast Scanning Module] | 2000 pix × 2000 pix |
| Scan Range [Fast Scan Module; 100X; Source Area Expression Retained] | 150 μm² |
| Scan Range [Fast Scan Module; 20X; Source Area Expression Retained] | 800 μm² |
| Minimum Dwell Time [Fast Scan Module; Source Comparison Sign Retained, HTML Feature 1us Retained Separately] | ≥1 us |
| Spectrometer | General Spectrometers, Fiber Spectrometers, etc. |
| Spectral Range [Spectrometer] | 200~1700 nm |
| Detector Type [Visible / Near-Infrared] | CCD、PMT、APD |
| Detector Wavelength [Visible / Near-Infrared] | 200~1000nm、1000~1700nm |
| Source Table | Keithley 2400/2600 (Domestic Alternative Optional) |
| Measurement Resolution [Source Table] | 1pA/100nV |
| Lock-In Amplifier | SRS SR830/860 (Domestic Alternative Optional) |
| Oscilloscope | Tektronix MDO02/3102 (Domestic Alternative Optional) |
| Bandwidth [Continuation Rows Immediately after Oscilloscope in Parameter Table] | 100MHz~1GHz |
| Probe Station | Custom |
Applications
Semiconductor Wafers and Optoelectronic Detectors;Semiconductor Photovoltaic and Light-Emitting Devices;Organic Solar Cells and OLEDs;Two-Dimensional Materials(Graphene,Molybdenum Disulfide,etc.) and Semiconductor Devices Based on Them;Fluorescent Nanomaterials;Ferroelectric Ceramics
Key Features
Highly Cost-Effective Photocurrent Imaging,Also Raman/Fluorescence Spectral Imaging;Photocurrent/Photocurrent Spectrum/Raman/PL and Other Modes;Near-UV,Visible and Near-IR Coverage;Modular,Plug-and-Play;Scan Range up to2000×2000 Pixels;Minimum Dwell1us
Datasheet
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Supplier Information
Starting from basic and simple optical spectroscopy and imaging modules to multi-functional and complex spectroscopy and imaging system solutions, Dowell Photonics has been committed to providing customized, personalized services and experiences. With exquisite technology, we design clever and flexible optical modules, making your experimental testing, R&D, and production no longer limited by instrument functions. We help you build, expand, and upgrade multi-functional spectroscopic testing systems to meet your special needs!
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