NDU4002
NDU4002 is a silicon avalanche photodiode in a small package, offering high gain, fast response, high operating frequency and high multiplication gain. High-Gain APD for Weak Light,Handheld/Scope Ranging,LiDAR,Medical Analysis;Precise Cost-Effective Molded Package without Filter;NBTech Co-Packable/Arrayable Chips,Developing Array/Quadrant/Special Shapes.
Specification Snapshot
Package Dimensions [Molded-Package APD Product; Parameter Image 01 Independent Selection Table]
3.8 mm × 3.8 mm × 3.6 mm
Chip Dimensions [Molded-Package APD Product; Parameter Image 01 Independent Selection Table]
0.67 mm × 0.67 mm
Photosensitive Region [Molded-Package APD Product; Parameter Image 01 Independent Selection Table]
Φ200
Photosensitive Wavelength [Molded-Package APD Product; Parameter Image 01 Independent Selection Table; Parenthesized Wavelength Has No Original Explanation and Is Not Assumed to Be a Peak]
400~1050nm(800nm)
Forward Current I_F [MAXIMUM RATINGS;Ta=25°C]
1 mA
Operating Temperature Topr. [MAXIMUM RATINGS;Ta=25°C]
-20~+60 °C
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Overview
NDU4002 is a silicon avalanche photodiode in a small package, offering high gain, fast response, high operating frequency and high multiplication gain.
High-Gain APD for Weak Light,Handheld/Scope Ranging,LiDAR,Medical Analysis;Precise Cost-Effective Molded Package without Filter;NBTech Co-Packable/Arrayable Chips,Developing Array/Quadrant/Special Shapes.
Specifications
| Parameter | Value |
|---|---|
| Package Dimensions [Molded-Package APD Product; Parameter Image 01 Independent Selection Table] | 3.8 mm × 3.8 mm × 3.6 mm |
| Chip Dimensions [Molded-Package APD Product; Parameter Image 01 Independent Selection Table] | 0.67 mm × 0.67 mm |
| Photosensitive Region [Molded-Package APD Product; Parameter Image 01 Independent Selection Table] | Φ200 |
| Reverse Breakdown Voltage V_BR [Molded-Package APD Product; Parameter Image 01 Independent Selection Table] | 80~120 V |
| Photosensitive Wavelength [Molded-Package APD Product; Parameter Image 01 Independent Selection Table; Parenthesized Wavelength Has No Original Explanation and Is Not Assumed to Be a Peak] | 400~1050nm(800nm) |
| Forward Current I_F [MAXIMUM RATINGS;Ta=25°C] | 1 mA |
| Peak Reverse Current I_R [MAXIMUM RATINGS;Ta=25°C] | 0.25 mA |
| Operating Temperature Topr. [MAXIMUM RATINGS;Ta=25°C] | -20~+60 °C |
| Storage Temperature Tstg. [MAXIMUM RATINGS;Ta=25°C] | -40~+80 °C |
| Soldering Temperature Tstg. [MAXIMUM RATINGS; Ta=25°C; Source Symbol Is Tstg., the Same as Storage Temperature; Retained as in Source] | 260 °C |
| Active Area Diameter [Independent Features on Page 1] | 200 μm |
| Spectral Response Range λ [Electro-optical characteristics;Ta=25°C;M=1] | min:400 nm; max:1050 nm |
| Peak Response Wavelength λ_P [Electro-optical characteristics;Ta=25°C] | typical:800 nm |
| Responsivity Re [Electro-optical characteristics; Ta=25°C; λ=800 (no unit specified in the source); M=1] | typical:0.45 A/W |
| Reverse Breakdown Voltage V_BR [Electro-optical characteristics;Ta=25°C;I_R=100μA] | min:80 V; max:120 V |
| Breakdown-Voltage Temperature Coefficient δ [Electro-optical characteristics;Ta=25°C] | typical:0.6 V/°C |
| Dark Current I_D [Electro-optical characteristics;Ta=25°C;M=100] | typical:0.05 nA; max:1 nA |
| Response Time ts [Electro-optical characteristics;Ta=25°C;M=100;R_L=50Ω;λ=800nm] | typical:0.1 ns |
| Capacitance C [Electro-optical characteristics;Ta=25°C;M=100;f=1MHz] | typical:1.2 pF |
| Cutoff Frequency f_C [Electro-optical characteristics;Ta=25°C;M=100;R_L=50Ω;λ=800nm;-3dB] | typical:1.5 GHz |
| Amplification Factor M [Electro-optical characteristics;Ta=25°C] | Typ:100 |
Applications
Laser Ranging,Warning and Radar;Weak-Light/Ultraweak-Pulse Optical Detection;Optical Communication
Laser Ranging, Telescopes, LIDAR, Low-Light Detection; Handheld Ranging, Rangefinding Telescopes, LIDAR and Medical Analysis
Key Features
Top-Surface Photosensitive Structure;Wavelength400–1050nm;Active-Area Diameter200um
635nm,650nm,905nm Avalanche Diodes;Fast Response,Low Dark Current;Molded/Ceramic Packages(with Filter);Custom Arrays;Molded APDs Have No Filter,Precise Dimensions and Good Cost Performance;APD Chips Can Be Copackaged/Arrayed;Array,Quadrant and Other Irregular APD Chips Under Development
Datasheet
Product Datasheet
PDF
Supplier Information
Shanghai Enbi Technology Co., Ltd., founded in 2016, focuses on optoelectronic technology R&D and production. Based on optoelectronic semiconductor discrete devices, it integrates optics, MEMS, electronics, microelectronics, semiconductor optoelectronic IC technologies, covering components, optoelectronic ICs, sensor modules, with full capability from chip design to module mass production, holding independent IP and unique testing systems. The company has an excellent management team and skilled staff, rich industry experience, strong R&D, efficient mass production and strict quality control, providing high-performance, reliable, cost-effective products; for special applications, we offer optimal optoelectronic solutions and custom products. Since its establishment, the company insists on independent innovation, quality first, continuously launching innovative products widely used in industrial equipment, automotive electronics, laser ranging, healthcare, instrumentation, security monitoring, smart home, etc., with performance replacing high-end foreign brands. Enbi Technology actively deploys in IoT, intelligent society, AI, driving industry upgrades, aiming to become a high-end optoelectronic brand.
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