Scattering-Type Terahertz Near-Field Scanning Probe System
Scattering-type scanning near-field optical microscopy (s-SNOM) uses a scattering point instead of a traditional aperture or fiber for higher spatial resolution. Jointly developed by the company and 广东省大湾区空天InformationResearch院, this system uses scattering-based core technology for spectra and near-field optical images with better than 10nm spatial resolution. Terahertz scanning/scattering atomic-force microscopy and simulation analyze nanostructures, exploring carrier properties in different structures and enhancement of THz local fields by different nanostructures.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Spatial Resolution | ≥50nm |
| Terahertz System Spectral Range | 0.1-3THz |
Key Features
Datasheet
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