Z-INSERT K-TYPE Nanopositioning Stage Z-INSERT K-TYPE.100
The Z-INSERT K-TYPE is a compact version of the Z-INSERT. Its length and width match a K-type sample holder (160mm x 110mm). Its 83.6 mm x 54 mm opening is compatible with our height-adjustable rectangular sample holder. The Z-INSERT K-TYPE fits most inverted and upright stages with K-type openings.
Specification Snapshot
Repeatability
0.2 nm
Resonant frequency
500 Hz
Cable length
2 m
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Overview
The Z-INSERT K-TYPE is a compact version of the Z-INSERT. Its length and width match a K-type sample holder (160mm x 110mm). Its 83.6 mm x 54 mm opening is compatible with our height-adjustable rectangular sample holder. The Z-INSERT K-TYPE fits most inverted and upright stages with K-type openings.
Specifications
| Parameter | Value |
|---|---|
| Range of motion | 100 µm |
| Resolution | 0.1 nm |
| Noise floor | typical:0.01 nm |
| Repeatability | 0.2 nm |
| Linearization | typical:0.02% |
| Resonant frequency | 500 Hz |
| Stiffness | 0.6 N/µm |
| Sensor | Silicon HR Sensor |
| Size W x L x H [height without sample holder] | 159.75 x 109.7 x 19.1 (height without sample holder) |
| Material | Aluminium |
| Cable length | 2 m |
| Controller | Standard |
| Maximum load* [Horizontal use] | 1 kg |
| Maximum load* [Vertical use] | 0.5 kg |
Datasheet
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Supplier Information
Beijing Naz Precision Technology Co., Ltd. was established in 2018, located in Haidian District, Beijing. The company is dedicated to precision positioning equipment, providing piezoelectric ceramic nano positioning stages, large stroke nano positioning stages, air bearing rotary tables, multi-axis stages, laser interferometers, etc., widely applied in metrology, microscopy, life sciences, laser technology, and semiconductor fields. It is the authorized dealer of German Smaract in China, and independently develops linear motors and air bearing stages. Its AFM ultra-thin ultra-stable linear stage is unique in China, and high-precision air bearing platforms provide domestic high-performance displacement stages for semiconductor inspection.
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