TY-HAST accelerated-life test chamber TY-HAST-40
The accelerated-life chamber is widely used for integrated circuits, microelectronics, ICs, and related fields. Increasing environmental stresses such as temperature and operating stresses such as applied voltage or load accelerates testing and shortens product or system lifetime tests. It investigates sample wear-out and service-life failures, the form of the failure-distribution function, and the causes of increasing failure rates.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Test-chamber dimensions [φ*D] | 400 mm × 500 mm |
| Outer-Carton Dimensions [W*H*D] | 709 mm × 950 mm × 1674 mm |
| Temperature-control range | 100°C-135°C |
| Temperature-fluctuation range [85°C~135°C/100%RH] | ±0.5°C |
| Humidity-control range | 65%RH~100%RH |
| Humidity-fluctuation range | ±3%RH |
| Maximum pressure | 0.019-0.208MPa |
| Power Supply | 220VAC ±10%, 50HZ, 20A |
| Applicable Standards | GB; ISO; ASTM; ULCEN-- |
Applications
Key Features
Datasheet
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