DMP7000/DMP7000-B - PD/APD wafer volume-production station
Ketai Guangxin's DMP7000 front-/back-illuminated APD wafer test system comprises an automatic probe-stage module, fiber-coupling module, testing module, custom probe-holder module, and drive/control software. It comprehensively evaluates bare chips with fast semiautomatic testing, high accuracy, and strong adaptability, fully meeting small-batch laboratory needs.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Sapphire-glass stage transmittance [Custom probe station; Original text states 90% or above] | ≥90 % |
| T-axis rotation angle [Custom probe station] | ±7 ° |
| Angular Resolution [Custom probe station] | 0.0007 ° |
| Flatness [Custom probe station] | ±10 μm |
| Z-axis travel [Custom probe station] | 10 mm |
| Z-axis resolution [Custom probe station] | 1 μm |
| Leakage current [Custom probe station] | ≤1 |
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