XONOX Vertical Large-Aperture Interferometer (Germany) VT750
The XONOX vertical interferometer systems include VT750, VT1200, and the downward-looking VT1000 DL, for optical inspection and radius-of-curvature measurement in production, quality control, and metrology laboratories.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Travel | min. 750 |
| Linear scale range | 800 mm |
| Test diameter [depending on used TS and part holder] | up to 200 |
| Fine adjustment [for easy and precise setting of catseye and confocal position] | micrometer fine adjustment |
| Measuring system | incremental high precision linear measuring system with PC interface |
| Measuring system attachment [option] | SRM-plus for short radius measurement |
| Laser distance measuring system [option] | available |
| Measuring accuracy [per 500 mm；source prints μ without an appended m] | up to ±0.7 |
| Resolution | up to 1 |
| Dimensions (W×D×H) [when using touch screen for fringe analysis；additional space required if PC is used for fringe analysis；XONOX PC-table optionally available] | 800 mm × 900 mm × 2100 mm |
| Weight | approx. 500 |
| Supply voltage [50–60 Hz] | 110–240 V |
| Supply frequency [110–240 V] | 50–60 Hz |
| Compressed air | 6 bar |
| Color | Light grey RAL 7035 |
Applications
Datasheet
Supplier Information
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