HAST Optimistic Aging Testing System B-HAST-D400
HASST is a high-accelerated pressure-advance system that applies to IC sealing, semiconductor, microelectronic chips, magnetic materials and other electronic parts for high pressure, high temperature, unsaturated/saturated wet heat, and accelerated life-trust tests, which are used during the design phase of the product for rapid exposure to defects and weaknesses. Tests of the product's sealing and ageing. B-HAST high-accelerated pressure-advance testing systems are placed in a certain ambient temperature (set by the specifications of the component) to apply a certain amount of bias pressure to the measured component. Control systems also detect leakages in real time from each material, voltage, and, depending on pre-set, automatically sever the electropressure of the material being measured when the real-time leak exceeds the set, can protect the monitored component from further burning.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Test temperature range [100%RH] | 105.0℃~133.3℃/100%RH |
| Test temperature range [85%RH] | 110.0℃~140.0℃/85%RH |
| Test temperature range [65%RH] | 118.0℃~150.0℃/65%RH |
| Humidity range | 65~100 %RH |
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Datasheet
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