B-HAST Optical Aging Testing System B-HAST-D400
The B-HAST high-accelerated pressure-advance system is applied to the IC containment, semiconductor, microelectronic chip, magnetic material and other electronic parts for accelerated life-trust tests of high pressure, high temperature, unsaturated/saturated wet heat, etc., which are used in the design phase of the product for rapid exposure of defects and weaknesses in the product. Tests of the sealing and ageing of its products. The B-HAST high-accelerated pressure-advation test system is designed to place the detector element in a given ambient temperature (set according to the specifications of the detector component) to apply a certain amount of bias pressure to the measured component. Controls the system to detect in real time the leakage of each material, voltage, and, depending on the pre-set, automatically to cut off the charge of the detected material when the real-time leak is beyond the set amount of power, protect the measured element from further burning.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Test temperature range [100%RH] | 105.0℃~133.3℃/100%RH |
| Test temperature range [85%RH] | 110.0℃~140.0℃/85%RH |
| Test temperature range [65%RH] | 118.0℃~150.0℃/65%RH |
| Humidity range | 65~100 %RH |
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Datasheet
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