Single Crystal Orientation DX-9B
DX-9B function: This instrument is a semi-automatic angle gauge to determine surface defects in single crystal material. Real-time data collected by a single-coast system are transmitted to the computer analysis system for data processing, thus obtaining peak angles and semi-wide (FWHW) values to determine the integrity of the surface of the crystal.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Input Power [50Hz] | Single-stage communication 220V, 50Hz, 0.3KW. |
| Plumb voltage. | 30 kV |
| Tube Current [Consequences.] | 0-5mA continuous |
| Detector | Scintillation detector, working at a maximum of DC1000V. |
| X-Ray Tube | Copper target, fan cooling, anode grounding. |
| Angle | 2θ=－10～120°，θ=－5～60°。 |
| Consolidated precision [Measured using the 10ī1 polished face of a standard quartz plate or a polished sapphire plate] | Return-swing curve measurement accuracy ±5″, measured using the 10ī1 polished face of a standard quartz plate or a polished sapphire plate. |
| Small readings | 1 ″ |
| Test speed [General sample; scan angle ±5ˊ; single or repeated measurement with sample stationary; same-point repeatability ≤±1″ in repeated measurements (standard polished quartz 10ī1 face or substrate-grade polished sapphire)] | A single measurement of a general sample takes 18 seconds (scan angle ±5ˊ). Single or repeated measurements can be made with the sample stationary. Same-point repeatability in repeated measurements is ≤±1″, measured using the 10ī1 face of a standard polished quartz plate or a substrate-grade polished sapphire plate. |
| Frequency of data collection | Data are collected once per 1 " (1/3600 degrees). |
| Storage function | The computer automatically records the results of each measurement, and when the test record is saved, click the transfer button to keep all records in the excel table. |
| Dimensions | Host 750 (long) × 682 (wide) × 690 (high) mm electrical 930 (long) × 790 wide) × 780 (high) mm |
| Instrument Weight | 140kg。 |
Key Features
Datasheet
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