Near-Infrared Acousto-Optic Modulator AOMO 3080-1990
AOMO 3080-1990 is a compact near-infrared acousto-optic modulator using tellurium dioxide as the acousto-optic medium. Designed for high-speed beam control in near-infrared laser systems, it provides fast optical switching, stable beam gating and precise intensity modulation. High diffraction efficiency, excellent acousto-optic interaction and reliable long-term operation meet modulation-accuracy and stability requirements in laboratory, industrial and OEM photonic systems. The excellent acousto-optic properties of TeO₂ allow AOMO 3080-1990 to modulate near-infrared laser beams efficiently and precisely, providing reliable beam-delivery control, optical-power management and precise timing control while maintaining good beam quality. Its compact design facilitates integration into space-constrained optical systems, providing stable, reliable modulation for high-performance laser equipment. Applications include laser imaging, optical sensing, precision instruments, laser processing, laboratory photonic systems and industrial OEM laser platforms, providing high-performance, highly reliable beam modulation and control for near-infrared laser applications.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Applicable Wavelength Band | Near Infrared |
| Minimum Wavelength | 750 nm |
| Maximum Wavelength | 1064 nm |
| Center Frequency | 80 MHz |
| Clear Aperture Dimension | 1 mm × 2 mm |
| Acousto-optic Medium | TeO₂ |
| Acoustic Velocity | 4.2 mm/μs |
| Rise/Fall Time | 159 ns |
| RF Bandwidth [-10 dB Return Loss] | 20 MHz(@ -10 dB Return Loss ) |
| Input Impedance | 50 Ω |
| Standing Wave Ratio | ≤ 1.3:1 |
| Insertion Loss | ≤ 5% |
| Single-Surface Reflectance | ≤ 1.5% |
| Optical Power Density | 250 W/mm² |
| Extinction Ratio | ≥1000:1 |
| Polarization | At a 90° angle to the mounting plane |
| Saturation RF Power [Wavelength ：750 nm] | 0.7 W |
| Bragg Angle [Wavelength ：750 nm] | 7.1 mrad |
| Beam Separation Angle [Wavelength ：750 nm] | 14.2 mrad |
| Saturation RF Power [Wavelength ：900 nm] | 1 W |
| Bragg Angle [Wavelength ：900 nm] | 8.6 mrad |
| Beam Separation Angle [Wavelength ：900 nm] | 17.2 mrad |
| Saturation RF Power [Wavelength ：1064 nm] | 1.3 W |
| Bragg Angle [Wavelength ：1064 nm] | 10 mrad |
| Beam Separation Angle [Wavelength ：1064 nm] | 20.26 mrad |
| Diffraction Efficiency [Beam Diameter :600 µm; Test Wavelength :750 nm] | >85% |
| Rise Time [Beam Diameter :600 µm; Test Wavelength :750 nm] | 96 ns |
| Diffraction Efficiency [Beam Diameter :600 µm; Test Wavelength :900 nm] | >85% |
| Rise Time [Beam Diameter :600 µm; Test Wavelength :900 nm] | 96 ns |
| Diffraction Efficiency [Beam Diameter :600 µm; Test Wavelength :1064 nm] | >85% |
| Rise Time [Beam Diameter :600 µm; Test Wavelength :1064 nm] | 96 ns |
Key Features
Datasheet
Supplier Information
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