Near-Infrared Acousto-Optic Modulator AOMO 3080-199
AOMO 3080-199 is a near-infrared acousto-optic modulator using tellurium dioxide as the acousto-optic medium. Designed for large-beam modulation, stable optical switching and precise beam control in 1064 nm laser systems, it provides high diffraction efficiency, low optical loss and excellent acousto-optic interaction to meet beam-stability, switching-reliability and long-term performance requirements in high-optical-flux laser systems. The excellent near-infrared acousto-optic properties of TeO₂ allow AOMO 3080-199 to provide efficient, stable laser modulation and reliable beam gating, optical-power management and timing control for 1064 nm laser systems. Large-beam accommodation, conduction cooling and high switching contrast improve thermal stability and meet precise beam-control and reliable-integration requirements in high-performance optical platforms. Applications include 1064 nm laser-processing systems, optical test platforms, research laser systems, laboratory photonics equipment and OEM laser instruments, providing stable, highly reliable beam modulation and control for high-power near-infrared laser applications.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Applicable Wavelength Band | Near Infrared |
| Minimum Wavelength | 875 nm |
| Maximum Wavelength | 1250 nm |
| Center Frequency | 80 MHz |
| Clear Aperture Dimension | 2 mm × 2.5 mm |
| Rise/Fall Time | 159 ns |
| Acousto-optic Medium | TeO₂ |
| Acoustic Velocity | 4.2 mm/μs |
| RF Bandwidth [-10 dB Return Loss] | 20 MHz(@ -10 dB Return Loss ) |
| Input Impedance | 50 Ω |
| Standing Wave Ratio | ≤ 2.0:1 |
| Insertion Loss | ≤ 4% |
| Single-Surface Reflectance | ≤ 0.5% |
| Antireflection Coating Standard | MIL-C-48497 |
| Optical Power Density | 50 MW/cm² |
| Extinction Ratio | ≥1000:1 |
| Polarization | At a 90° angle to the mounting plane |
| Saturation RF Power [Wavelength ：1064 nm] | 2.8 W |
| Bragg Angle [Wavelength ：1064 nm] | 10.1 mrad |
| Beam Separation Angle [Wavelength ：1064 nm] | 20.2 mrad |
| Diffraction Efficiency [Beam Diameter :2000 μm; Test Wavelength :1064 nm] | 85% |
| Rise Time [Beam Diameter :2000 μm; Test Wavelength :1064 nm] | 318 ns |
Key Features
Datasheet
Supplier Information
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