Red-to-Near-Infrared Acousto-Optic Modulators AOMO 3200-124
AOMO 3200-124 is a compact red-to-near-infrared acousto-optic modulator using tellurium dioxide as the acousto-optic medium. Designed for small-beam laser systems, it provides high-speed optical switching, beam gating and dynamic intensity modulation. High diffraction efficiency, low insertion loss and fast response meet beam-control accuracy, stability and system-integration requirements in precision laser systems. The excellent acousto-optic properties of TeO₂ allow AOMO 3200-124 to provide efficient, stable acousto-optic interaction from red to near-infrared wavelengths, supporting reliable beam modulation, optical-power control and precise timing management. Optimized for small-diameter beams, it combines high switching contrast, excellent beam-quality preservation and compact construction. Burn-in testing verifies stable modulation during long-term operation. Applications include optical sensing, optical imaging systems, precision analytical instruments, optical test platforms, laboratory photonic systems and research laser platforms, providing high-performance, highly reliable beam modulation and control for red and near-infrared laser applications.
Overview
Specifications
| Parameter | Value |
|---|---|
| Applicable Wavelength Band | Red Light - Near Infrared |
| Minimum Wavelength | 730 nm |
| Maximum Wavelength | 930 nm |
| Center Frequency | 200 MHz |
| Clear Aperture Dimension | 0.32 mm × 2.5 mm |
| Rise/Fall Time | 159 ns |
| Acousto-optic Medium | TeO₂ |
| Acoustic Velocity | 4.2 mm/μs |
| RF Bandwidth [-10 dB Return Loss] | 50 MHz(@ -10 dB Return Loss ) |
| Input Impedance [Rated Value] | 50 Ω (rated value) |
| Standing Wave Ratio | ≤ 1.3:1 |
| Insertion Loss | ≤ 3% |
| Single-Surface Reflectance | ≤ 1% |
| Antireflection Coating Standard | MIL-C-48497 |
| Optical Power Density | 250 W/mm² |
| Extinction Ratio | ≥1000:1 |
| Polarization | At a 90° angle to the mounting plane |
| Saturation RF Power [Wavelength :830 nm] | 2.0 W |
| Bragg Angle [Wavelength :830 nm] | 19.8 mrad |
| Beam Separation Angle [Wavelength :830 nm] | 39.6 mrad |
| Diffraction Efficiency [Beam Diameter :150 μm; Wavelength :830 nm] | 70% |
| Rise Time [Beam Diameter :150 μm; Wavelength :830 nm] | 29 ns |
| Modulation Bandwidth [Beam Diameter :150 μm; Wavelength :830 nm] | 21.0 MHz |
| Beam Ellipticity [Beam Diameter :150 μm; Wavelength :830 nm] | 10 |
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